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Conferences

Reconstruction and Preliminary Tests of the NIST Electronic Kilogram Experiment

May 1, 2000

Author(s)

Richard L. Steiner, David B. Newell, J. Schwarz, Edwin R. Williams, Ruimin Liu

The NIST electronic kilogram experiment is being completely rebuilt into a vaccum chamber within a specially designed laboratory room. Major renovations include...

Improved Time-Base for Waveform Parameter Estimation

May 1, 2000

Author(s)

Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken

An improved gated-oscillator time-base and associated auto-calibration algorithm for use in a high-accuracy sampling waveform acquistion system are described...

A New Fabrication Process for Planar Thin-Film Multijunction Thermal Converters

May 1, 2000

Author(s)

Thomas F. Wunsch, Joseph R. Kinard Jr., Ronald R. Manginell, O. M. Solomon, Thomas E. Lipe Jr.

Advanced thin flm processing and packaging technologies are employed in the fabrication of new planar thin-film multijunction thermal converters. The processing...

Comparison of High Frequency AC-DC Voltage Transfer Standards at NRC, VSL, PTB, and NIST

May 1, 2000

Author(s)

Piotr S. Filipski, C. J. van Mullem, D. Janik, M. Klonz, Joseph R. Kinard Jr., Thomas E. Lipe Jr., Bryan C. Waltrip

The paper summarizes results of two international comparisons relating TVC RF voltage transfer standards of the National Research Council of Canada (NRC) to the...

Characterization of Four-Terminal-Pair Resistance Standards: A Comparison of Measurements and Theory

May 1, 2000

Author(s)

Randolph Elmquist, Anne-Marie Jeffery, Dean G. Jarrett

Coaxial straight-wire resistance standards with calculable frequency dependence have been used to tie alternating-current (ac) measurements to direct-current...

International Comparison of 50/60 Hz Power (1996-1999)

May 1, 2000

Author(s)

Nile M. Oldham, Thomas L. Nelson, R. Bergeest, R. Carranza, M. Gibbes, K Jones, Gregory Kyriazis, H. Laiz, L. Liu, Z. Lu, U. Pogliano, K. E. Rydler, E. Shapiro, E. So, M. Temba, P. Wright

An International Comparison of 50/60 Hz Power is described. The traveling standard was an electronic power transducer which was tested at 120 volts, 5 amperes...

Non-Iterative Waveform Deconvolution Using Analytic Reconstruction Filters with Time-Domain Weighting

May 1, 2000

Author(s)

Sandip Roy, T. M. Souders

A new deconvolution approach is described for reconstructing fast step-like or impulsive signals that have been measured with a sampling oscilloscope for which...

A Multi-Frequency 4-Terminal-Pair AC Bridge

May 1, 2000

Author(s)

Anne-Marie Jeffery, John Q. Shields, Scott H. Shields

A 4-terminal-pair ac bridge, capable of a relative uncertainty of 2 x 10^-9^, has been constructed at NIST. The bridge is a multi-ratio bridge (10:1, 2:1 and 1...

The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method

May 1, 2000

Author(s)

Donald R. Larson, Nicholas Paulter

The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset...

4 Amp 4H-SiC JBD Diodes

May 1, 2000

Author(s)

Ranbir Singh, Sei-Hyung Ryu, M. Palmer, Allen R. Hefner Jr., Jih-Sheng Lai

Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA)

May 1, 2000

Author(s)

Yi-hua D. Tang, W. Wyatt Miller

Two JVS systems operated at the NIST and LMA were compared by using four traveling Zener standards. A MAP protocol was adopted for the comparison. The mean...

Imaging of Composite Defects and Damage Using Optical Coherence Tomography

May 1, 2000

Author(s)

Joy Dunkers, M J. Everett, D P. Sanders, Donald L. Hunston

The Composites Group at the National Institute of Standards and Technology has found optical coherence tomography (OCT) to be a powerful tool for non...

Effect of Water Exposure Cycles on Physical Properties of a Partical-Filled, Epoxy-Based Adhesive

May 1, 2000

Author(s)

Martin Chiang, M Fernandez-Garcia, E M. Yorkgitis

The effect of cyclic hygrothermal aging on a particle-filled, epoxy-based adhesive was studied using a sequence of water absorption, desorption and reabsorption...

A Test Method for Assessing Interfacial Shear Strength in Composites

May 1, 2000

Author(s)

Gale A. Holmes, Donald L. Hunston, Walter G. McDonough, R C. Peterson

Two of the critical factors controlling the long-term performance and durability of composites in structural applications is the fiber-matrix interfacial shear...

Comparison Between the SNS and SIS Josephson Voltage Standards at NIST

May 1, 2000

Author(s)

Blaise Jeanneret, Alain Rufenacht, Charles J. Burroughs

International Comparison GT/RF 86-1 Electrical Field Strengths, 27 MHz to 10 GHz

May 1, 2000

Author(s)

Motohisa Kanda, Dennis G. Camell, J. Achkar, M. Alexander, Jan P. deVreede, Michele Borsero, H. Yajima, N. S. Chung, H. Trzaska

This paper descirbes the international comparison of electric field strength measurements at frequencies between 27 MHz and 10 GHz (GT/RF 86-1). The...

Complex Permittivity Measurements of Single-Crystal and Ceramic Strontium Titanate at Microwave Frequencies and Cryogenic Temperatures

May 1, 2000

Author(s)

Jerzy Krupka, James R. Baker-Jarvis, Richard G. Geyer

The permittivity and dielectric loss tangent of bulk strontium titanate were measured from 4 to 3pp K, at frequencies from 400 MHz to 3.8 GHz, using a...

ATLAS: A Flexible and Extensible Architecture for Linguistic Annotation

May 1, 2000

Author(s)

S Bird, D Day, John S. Garofolo, J Henderson, Christophe Laprun, M Liberman

We describe a formal model for annotating linguistic artifacts, from which we derive an application programming interface (API) to a suite of tools for...

Long-Period Gratings as Flow Sensors for Liquid-Composite Molding

May 1, 2000

Author(s)

S R. Kueh, Richard~undefined~undefined~undefined~undefined~undefined Parnas, Joy Dunkers, S G. Advanti, P S. Furrows, M E. Jones, T A. Bailey

One of the most important issues in liquid composite molding (LCM) is the complete saturation of the preform by the resin to eliminate voids or dry spots in the...

Standard Reference Materials: Non-Newtonian Fluids for Rheological Measurements

May 1, 2000

Author(s)

Carl R. Schultesiz, G B. McKenna

NIST develops Standard Reference Materials for calibration, quality assurance and research into improved measurements. Two fluid standards are being developed...

Superconducting Transition-Edge Bolometer Arrays for Ultra-Low Power Radiometry

May 1, 2000

Author(s)

Erich N. Grossman, James A. Chervenak, Kent D. Irwin, Carl D. Reintsema

A new generation of ultra-low power bolometer arrays is under development for low background infrared astronomy. This paper describes radiometric measurements...

Polarization Correlations in Pulsed VCSELs

May 1, 2000

Author(s)

D. R. Shelly, T. W. Garrison, M. Beck, David H. Christensen

We have measured the correlations between the two orthogonal linearly polarized outputs of a pulsed vertical-cavity, surface-emitting laser and found them to be...

Improvements in the NIST Cryogenic Thermal Transfer Standard

May 1, 2000

Author(s)

Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema

Recent improvements in the prototype of an ac-dc thermal transfer standard operating at cryogenic temperatures are described. Descriptions of two new...

A High-Temperature Superconducting Transmission Line For Cryogenic Electrical Metrology Applications

May 1, 2000

Author(s)

Carl D. Reintsema, Joseph R. Kinard Jr., Thomas E. Lipe Jr.

This paper describes the design, realization, and testing of a high-temperature superconducting (HTS) transmission line structure for delivering calibrated dc...

An Automated Hierarchical Process Planning System

April 28, 2000

Author(s)

Thomas R. Kramer, Hui-Min Huang, Elena R. Messina, Frederick M. Proctor, Harry A. Scott

This paper describes an automated hierarchical process planning system for machining and inspecting discrete parts in an RCS type control system. The system...

Characterization of Electrical Linewidth Test Structures Patterned in (100) Silicon-on-Insulator for Use as CD Standards

April 6, 2000

Author(s)

Michael W. Cresswell, Richard A. Allen, Rathindra Ghoshtagore, Nadine Guillaume, Patrick J. Shea, Sarah C. Everist, Loren W. Linholm

Burning Item Sub-Models.

April 4, 2000

Author(s)

V Babrauskas

Asia

April 4, 2000

Author(s)

Y Hasemi

Planck Constant Determination from Power Equivalence

April 1, 2000

Author(s)

David B. Newell

Equating mechanical to electrical power links the kilogram, the meter, and the second to the practical realizations of the ohm and the volt derived from the...

Compositional Analysis of NIST Reference Material Clinker 8486

April 1, 2000

Author(s)

Paul E. Stutzman, Germain Lespinasse, Stefan D. Leigh

Certification of the phase compositions of the NIST Reference Clinkers often is based upon more than one independent method. The current certificate values were...

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