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Conferences

Superconducting Transition-Edge Bolometer Arrays for Ultra-Low Power Radiometry

May 1, 2000

Author(s)

Erich N. Grossman, James A. Chervenak, Kent D. Irwin, Carl D. Reintsema

A new generation of ultra-low power bolometer arrays is under development for low background infrared astronomy. This paper describes radiometric measurements...

Polarization Correlations in Pulsed VCSELs

May 1, 2000

Author(s)

D. R. Shelly, T. W. Garrison, M. Beck, David H. Christensen

We have measured the correlations between the two orthogonal linearly polarized outputs of a pulsed vertical-cavity, surface-emitting laser and found them to be...

Improvements in the NIST Cryogenic Thermal Transfer Standard

May 1, 2000

Author(s)

Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema

Recent improvements in the prototype of an ac-dc thermal transfer standard operating at cryogenic temperatures are described. Descriptions of two new...

A High-Temperature Superconducting Transmission Line For Cryogenic Electrical Metrology Applications

May 1, 2000

Author(s)

Carl D. Reintsema, Joseph R. Kinard Jr., Thomas E. Lipe Jr.

This paper describes the design, realization, and testing of a high-temperature superconducting (HTS) transmission line structure for delivering calibrated dc...

An Automated Hierarchical Process Planning System

April 28, 2000

Author(s)

Thomas R. Kramer, Hui-Min Huang, Elena R. Messina, Frederick M. Proctor, Harry A. Scott

This paper describes an automated hierarchical process planning system for machining and inspecting discrete parts in an RCS type control system. The system...

Characterization of Electrical Linewidth Test Structures Patterned in (100) Silicon-on-Insulator for Use as CD Standards

April 6, 2000

Author(s)

Michael W. Cresswell, Richard A. Allen, Rathindra Ghoshtagore, Nadine Guillaume, Patrick J. Shea, Sarah C. Everist, Loren W. Linholm

Burning Item Sub-Models.

April 4, 2000

Author(s)

V Babrauskas

Asia

April 4, 2000

Author(s)

Y Hasemi

Planck Constant Determination from Power Equivalence

April 1, 2000

Author(s)

David B. Newell

Equating mechanical to electrical power links the kilogram, the meter, and the second to the practical realizations of the ohm and the volt derived from the...

Compositional Analysis of NIST Reference Material Clinker 8486

April 1, 2000

Author(s)

Paul E. Stutzman, Germain Lespinasse, Stefan D. Leigh

Certification of the phase compositions of the NIST Reference Clinkers often is based upon more than one independent method. The current certificate values were...

The Past, Present, and Future of the Computational Materials Science of Concrete

April 1, 2000

Author(s)

Edward J. Garboczi, Dale P. Bentz, G J. Frohnsdorff

The computational materials science of concrete has developed rapidly in the last 15 years. This development has been strongly tied to the even more rapid...

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

April 1, 2000

Author(s)

Michael Kennedy, Matthew A. Davies, Howard W. Yoon, Timothy J. Burns

A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the...

Controller Driven VRML Animation of the NIST Robotic Welding Cell

April 1, 2000

Author(s)

Keith A. Stouffer

Virtual objects in a web-based environment can be interfaced to and controlled by external real world controllers. A Virtual Reality Modeling Language (VRML)...

Efficiency Testing of ANSI C Implementations of Round 2 Candidate Algorithms for the Advanced Encryption Standard

April 1, 2000

Author(s)

Lawrence E. Bassham

This paper describes the testing methodology used in ANSI C efficiency testing of the Round 2 Candidates for the Advanced Encryption Standard, along with a few...

Common Industry Format for Usability Test Reports

April 1, 2000

Author(s)

Jean C. Scholtz

This paper is a proposal for conducting a Special Interest Group (SIG) at the CHI2000 Conference. The focus of the meeting will be the use of the Common...

Structure and Magnetism in the Systems Zr₃(Rh_1-xRu_x)₄ and Zr₃(Rh_1-yPd_y)₄

April 1, 2000

Author(s)

Lawrence H. Bennett, Richard M. Waterstrat, L Swartzendruber, H J. Brown, R E. Watson

The Zr 3(Rh 1-yPd y) 4 system in the Pu 3Pd y) 4 structure, which has been reported on previously, is further investigated here. It exhibits an incommensurate...

Permittivity Measurements of High Dielectric Constant Films at Microwave Frequencies

April 1, 2000

Author(s)

Jan Obrzut, R Nozaki

We have developed a time-domain reflectometry (TDR) technique to measure the dielectric permittivity of high dielectric constant films. The test specimen...

A Three-Phase Model for the Structure of Porous Thin Films Determined by X-Ray Reflectivity and Small Angle Neutron Scattering

April 1, 2000

Author(s)

Wen-Li Wu, Eric K. Lin, C Jin, J T. Wetzel

A methodology to characterize nanoporous thin films based on a novel combination of high resolution specular x-ray reflectivity and small angle neutron...

NIST-BMDO Transfer Radiometer (BXR)

April 1, 2000

Author(s)

Timothy M. Jung, Adriaan C. Carter, Steven R. Lorentz, Raju V. Datla

An infrared transfer radiometer has been recently developed for the Low-Background Infrared Calibration (LBIR) facility at the National Institute of Standards...

NIST Facility for Spectral Calibration of Detectors: Calibration of Arsenic-Doped Silicon-Blocked Impurity Band Detectors

April 1, 2000

Author(s)

Adriaan C. Carter, Steven R. Lorentz, Timothy M. Jung, Beverly Klemme, Raju V. Datla

The capability of the Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology to spectrally calibrate infrared detectors...

Calibration of Lightpipe Radiation Thermometers in a RTP Tool at 1000 C

April 1, 2000

Author(s)

Kenneth G. Kreider, D P. DeWitt, Christopher W. Meyer, Vincent P. Scheuerman

We are developing an instrumented calibration wafer for radiometric temperature measurements in rapid thermal processing (RTP) that uses Pt/Pd wire and noble...

The TREC Spoken Document Retrieval Track: A Success Story

April 1, 2000

Author(s)

John S. Garofolo, C G. Auzanne, Ellen M. Voorhees

This paper describes work within the NIST Text REtrieval Conference (TREC) over the last three years in designing and implementing evaluations of Spoken...

Design and Performance of an Inductive Current Probe Integrated into the Trace Suspension Assembly

April 1, 2000

Author(s)

Thomas J. Silva, Pavel Kabos, Donald C. DeGroot, L Webb, M Even

Dielectric Measurements of Substrates and Packaging Materials

April 1, 2000

Author(s)

James R. Baker-Jarvis, Billy F. Riddle

We summarize measurement results on many polymer, ceramic, and composite substrate and packaging materials. Measurements on low-loss materials are obtained from...

World Modeling and Behavior Generation for Autonomous Ground Vehicles

April 1, 2000

Author(s)

Stephen B. Balakirsky, Alberto Lacaze

Robotics & Intelligent Systems, Unmanned Systems, Mobility

Phenolic Cyanate Ester Clay Nanocomposites: Effect of Ammonium Ion Structure on Flammability and Nano-Dispersion.

March 26, 2000

Author(s)

Jeffrey W. Gilman, Richard H. Harris Jr., C L. Jackson, A B. Morgan, L D. Brassell, D L. Hunter

Architecture, Design Methodology, and Component-Based Tools for a Real-Time Inspection System

March 17, 2000

Author(s)

John A. Horst

We describe a real-time, component-based system for an inspection application. We chose the inspection application and the accompanying task (or scenario) so...

In Situ Diffuse Reflectance Spectroscopy for Measurement and Control of III-V Molecular Beam Epitaxy

March 17, 2000

Author(s)

Jonathan E. Guyer, W. F. Tseng, W. R. Thurber, Eric M. Vogel, Monica D. Edelstein, Donald A. Gajewski, Joseph G. Pellegrino

We report the use of diffuse reflectance spectroscopy for active, closed-loop control of substrate temperature during the growth of a modulation doped...

An Overview of Nano-Micro-Meso Scale Manufacturing at the NIST

March 13, 2000

Author(s)

E Amatucci, Nicholas Dagalakis, Bradley N. Damazo, Matthew A. Davies, John Evans, Jun-Feng Song, E C. Teague, Theodore V. Vorburger

The future of nano-, micro- and meso-scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be...

Development of a Continuous Flow Flame Test Extruder for High-Throughput Formulation and Screening of Flame Retardants and More Fire Resistant Materials

March 12, 2000

Author(s)

Marc R. Nyden, Jeffrey W. Gilman

The purpose of this paper is to initiate discussion on the viability of using a high-throughput approach, based on the combinatorial methodology that has been...

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