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Conferences

Report on the CCEM Comparison of 10 pF Capacitance Standards

May 1, 2000

Author(s)

Anne-Marie Jeffery

This paper describes the recent Comite Consultatif d'Electricite et Magnetisme (CCEM) comparison of 10 pF capacitors. The comparison of electrical standards...

A Dual-Balance High-Resistance Bridge in the Range of 1 T{Ω} to 100 T{Ω}

May 1, 2000

Author(s)

Dean G. Jarrett

The NIST dual-balance guarded active-arm bridge, using a third dc source and a second detector to balance the guard network, is described. Improvements to the...

Nonrandom Quantization Errors in Timebases

May 1, 2000

Author(s)

Gerard N. Stenbakken, D. Liu, J. A. Starzyk, Bryan C. Waltrip

Timebase distortion causes nonlinear distortion of waveforms measured by sampling instruments. When such instruments are used to measure the rms amplitude of...

Ultra-Low Resistance Contacts to GaAs/AlGaAs Quantized Hall Resistors

May 1, 2000

Author(s)

Kevin C. Lee

Contacts to quantized Hall resistors (QHRs) must meet demanding specifications for contact resistance, reliability, ruggedness, and resistance to degradation. A...

NIST 0.05-50 GHz Direct Comparison Power Calibration System

May 1, 2000

Author(s)

John R. Juroshek

Fatigue Model for Fiber-Reinforced Polymeric Composites in Civil Engineering Applications

May 1, 2000

Author(s)

Hai C. Tang, Tinh Nguyen, Joannie W. Chin, J Lesko, Tze J. Chuang

A fatigue model based on cumulative damage is developed for predicting the fatigue life of fiber-reinforced polymeric composites in offshore applications. This...

A More Efficient Use of Δ-CRLs

May 1, 2000

Author(s)

David A. Cooper

Δ-Certificate revocation lists (delta-CRLs) were designed to provide a more efficient way to distribute certificate status information. However, as this paper...

Thermally Induced Deformations in a Flip-Chip HDI Substrate

May 1, 2000

Author(s)

Elizabeth S. Drexler

At issue was the thermomechanical response of microvias in a high-density interconnect (HDI) substrate. The HDI package containing microvias, blind vias, solder...

Experiments With Strontium in a Vapor Cell Magneto-Optic Trap

May 1, 2000

Author(s)

K R. Vogel, Tim P. Dinneen, Alan Gallagher, J L. Hall

In a ceramic vapor cell we have created a robust Sr magneto-optical trap that stores about 10 8 atoms with lifetimes > 200 ms. We eliminate the 5p 1P 1->4d 1 d2...

Derivatization of Plastic Microfluidic Devices With Polyelectrolyte Multilayers

May 1, 2000

Author(s)

S L. Barker, Michael J. Tarlov, M L. Branham, J Xu, William A. MacCrehan, Michael Gaitan, Laurie E. Locascio

Microchannels fabricated in plastic materials by room temperature imprinting demonstrate large variability in surface charge as a result of the fabrication...

An Ab initio-Based Screening Tool for the Atmospheric Lifetimes of Halon Replacements

May 1, 2000

Author(s)

Robert E. Huie, F Louis, Carlos A. Gonzalez, Michael J. Kurylo III

The abstraction of hydrogen atoms by hydroxyl radicals is the determining factor in the tropospheric lifetimes of most saturated organic compounds, including...

Variation in the Formal Reduction Potential of an (2FE-2S) Iron-Sulfur Protein and its Mutants

May 1, 2000

Author(s)

V L. Vilker, Vytautas Reipa, Marcia J. Holden, M P. Mayhew

We have been pursuing the detailed pathway by which cytochrome P450cam (CYP101) transfers electrons through a three diffusible protein subunit system, and how...

Molecular Measuring Machine Design and Measurements

May 1, 2000

Author(s)

John A. Kramar, Jay S. Jun, William B. Penzes, Fredric Scire, E C. Teague, John S. Villarrubia

We at the National Institute of Standards and Technology are building a metrology instrument called the Molecular Measuring Machine (M3) with the goal of...

Measurement of the Frequency Dependence of a Single-Electron Tunneling Capacitance Standard

May 1, 2000

Author(s)

Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman

In the context of a proposed new capacitance standard based on counting electrons, we discuss a method to investigate its frequency dependence. We describe...

Noise-Source Stability Measurements

May 1, 2000

Author(s)

James P. Randa, L. A. Terrell, Lawrence P. Dunleavy

We report results of stability tests on several noise sources for selected frequencies between 12 and 26.5 GHz. Measurements covered intervals of about 1 week...

Modeling the Microstructure and Elastic Properties of Complex Materials

May 1, 2000

Author(s)

A P. Roberts, Edward Garboczi

This document is derived from three reviewed papers by the same authors: (1)Elastic properties of a tungsten-silver composite by reconstruction and computation...

Critical Gaps in Durability Data for FRP Composites in Civil Infrastructure

May 1, 2000

Author(s)

V M. Karbhari, Joannie W. Chin, D R. Reynaud

Although fiber reinforced polymer (FRP) composites are increasingly being used for the renewal of civil infrastructure, there are still some major questions...

1 Volt Josephson Fast Reversed DC Source

May 1, 2000

Author(s)

Charles J. Burroughs, Samuel Benz, Todd E. Harvey, H. Sasaki

We have made several improvements to the NIST Josephson FRDC (fast reversed dc) source so that it now operates at 1 Volt. We have made a precision comparison to...

DC Voltage Synthesis Using a Pulse-Quantized Josephson Voltage Source

May 1, 2000

Author(s)

Samuel Benz, Laurie Christian, Charles J. Burroughs, Clark A. Hamilton

We have synthesized and measured dc voltages using a bipolar pulse-quantized Josephson voltage waveform synthesizer. Bias current ranges were determined for 101...

RF Material Characterization Using a Large-Diameter (76.8 mm) Coaxial Air Line

May 1, 2000

Author(s)

Chriss A. Jones, John H. Grosvenor Jr, Claude Weil

We report the development of a 76.84 mm (3.025 in) diameter coaxial air line system whose purpose is to measure the dielectric and magnetic properties of bulk...

Compact Photoconductive-based Sampling System with Electronic Sampling Delay

May 1, 2000

Author(s)

W. L. Cao, M. Du, C G. Lee, Nicholas Paulter

As electronic signals move to higher frequencies and wider bandwidths, there is need for new methods of measuring these bandwidths, there is need for new...

Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction

May 1, 2000

Author(s)

X. Han, Gerard N. Stenbakken, F. J. Von Zuben, Hans Engler

This paper explores the neural network approach for empirical nonlinear error modeling. For systems that have a significant amount of nonlinearity, nonlinear...

Recent Developments in BIPM Voltage Standard Comparisons

May 1, 2000

Author(s)

D. Reymann, Thomas J. Witt, P. Vrabcek, Yi-hua D. Tang, Clark A. Hamilton, A. S. Katkov, Blaise Jeanneret, O. Power

The BIPM carries out a number of comparisons of DC voltage standards with National Metrology Institutes. These take the form of on-site comparisons of Josephson...

Long-Term Charge Offset and Glassy Dynamics in SET Transistors

May 1, 2000

Author(s)

Neil M. Zimmerman, William Huber

We report long-term measurements of the charge offset Q 0 in SET (single-electron tunneling) transistors, made of Al/AlO x/Al tunnel junctions. In one case, we...

Complete Characterization of Zener Standards at 10 V for Measurement Assurance Program (MAP)

May 1, 2000

Author(s)

Yi-hua D. Tang, June E. Sims

A Complete characterization of Zener standards for temperature, pressure, and humidity is being performed to improve the uncertainty of a MAP that uses 10 V...

Reconstruction and Preliminary Tests of the NIST Electronic Kilogram Experiment

May 1, 2000

Author(s)

Richard L. Steiner, David B. Newell, J. Schwarz, Edwin R. Williams, Ruimin Liu

The NIST electronic kilogram experiment is being completely rebuilt into a vaccum chamber within a specially designed laboratory room. Major renovations include...

Improved Time-Base for Waveform Parameter Estimation

May 1, 2000

Author(s)

Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken

An improved gated-oscillator time-base and associated auto-calibration algorithm for use in a high-accuracy sampling waveform acquistion system are described...

A New Fabrication Process for Planar Thin-Film Multijunction Thermal Converters

May 1, 2000

Author(s)

Thomas F. Wunsch, Joseph R. Kinard Jr., Ronald R. Manginell, O. M. Solomon, Thomas E. Lipe Jr.

Advanced thin flm processing and packaging technologies are employed in the fabrication of new planar thin-film multijunction thermal converters. The processing...

Comparison of High Frequency AC-DC Voltage Transfer Standards at NRC, VSL, PTB, and NIST

May 1, 2000

Author(s)

Piotr S. Filipski, C. J. van Mullem, D. Janik, M. Klonz, Joseph R. Kinard Jr., Thomas E. Lipe Jr., Bryan C. Waltrip

The paper summarizes results of two international comparisons relating TVC RF voltage transfer standards of the National Research Council of Canada (NRC) to the...

Characterization of Four-Terminal-Pair Resistance Standards: A Comparison of Measurements and Theory

May 1, 2000

Author(s)

Randolph Elmquist, Anne-Marie Jeffery, Dean G. Jarrett

Coaxial straight-wire resistance standards with calculable frequency dependence have been used to tie alternating-current (ac) measurements to direct-current...

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