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Conferences

Modeling the Microstructure and Elastic Properties of Complex Materials

May 1, 2000

Author(s)

A P. Roberts, Edward Garboczi

This document is derived from three reviewed papers by the same authors: (1)Elastic properties of a tungsten-silver composite by reconstruction and computation...

Critical Gaps in Durability Data for FRP Composites in Civil Infrastructure

May 1, 2000

Author(s)

V M. Karbhari, Joannie W. Chin, D R. Reynaud

Although fiber reinforced polymer (FRP) composites are increasingly being used for the renewal of civil infrastructure, there are still some major questions...

1 Volt Josephson Fast Reversed DC Source

May 1, 2000

Author(s)

Charles J. Burroughs, Samuel Benz, Todd E. Harvey, H. Sasaki

We have made several improvements to the NIST Josephson FRDC (fast reversed dc) source so that it now operates at 1 Volt. We have made a precision comparison to...

DC Voltage Synthesis Using a Pulse-Quantized Josephson Voltage Source

May 1, 2000

Author(s)

Samuel Benz, Laurie Christian, Charles J. Burroughs, Clark A. Hamilton

We have synthesized and measured dc voltages using a bipolar pulse-quantized Josephson voltage waveform synthesizer. Bias current ranges were determined for 101...

RF Material Characterization Using a Large-Diameter (76.8 mm) Coaxial Air Line

May 1, 2000

Author(s)

Chriss A. Jones, John H. Grosvenor Jr, Claude Weil

We report the development of a 76.84 mm (3.025 in) diameter coaxial air line system whose purpose is to measure the dielectric and magnetic properties of bulk...

Compact Photoconductive-based Sampling System with Electronic Sampling Delay

May 1, 2000

Author(s)

W. L. Cao, M. Du, C G. Lee, Nicholas Paulter

As electronic signals move to higher frequencies and wider bandwidths, there is need for new methods of measuring these bandwidths, there is need for new...

Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction

May 1, 2000

Author(s)

X. Han, Gerard N. Stenbakken, F. J. Von Zuben, Hans Engler

This paper explores the neural network approach for empirical nonlinear error modeling. For systems that have a significant amount of nonlinearity, nonlinear...

Recent Developments in BIPM Voltage Standard Comparisons

May 1, 2000

Author(s)

D. Reymann, Thomas J. Witt, P. Vrabcek, Yi-hua D. Tang, Clark A. Hamilton, A. S. Katkov, Blaise Jeanneret, O. Power

The BIPM carries out a number of comparisons of DC voltage standards with National Metrology Institutes. These take the form of on-site comparisons of Josephson...

Long-Term Charge Offset and Glassy Dynamics in SET Transistors

May 1, 2000

Author(s)

Neil M. Zimmerman, William Huber

We report long-term measurements of the charge offset Q 0 in SET (single-electron tunneling) transistors, made of Al/AlO x/Al tunnel junctions. In one case, we...

Complete Characterization of Zener Standards at 10 V for Measurement Assurance Program (MAP)

May 1, 2000

Author(s)

Yi-hua D. Tang, June E. Sims

A Complete characterization of Zener standards for temperature, pressure, and humidity is being performed to improve the uncertainty of a MAP that uses 10 V...

Reconstruction and Preliminary Tests of the NIST Electronic Kilogram Experiment

May 1, 2000

Author(s)

Richard L. Steiner, David B. Newell, J. Schwarz, Edwin R. Williams, Ruimin Liu

The NIST electronic kilogram experiment is being completely rebuilt into a vaccum chamber within a specially designed laboratory room. Major renovations include...

Improved Time-Base for Waveform Parameter Estimation

May 1, 2000

Author(s)

Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken

An improved gated-oscillator time-base and associated auto-calibration algorithm for use in a high-accuracy sampling waveform acquistion system are described...

A New Fabrication Process for Planar Thin-Film Multijunction Thermal Converters

May 1, 2000

Author(s)

Thomas F. Wunsch, Joseph R. Kinard Jr., Ronald R. Manginell, O. M. Solomon, Thomas E. Lipe Jr.

Advanced thin flm processing and packaging technologies are employed in the fabrication of new planar thin-film multijunction thermal converters. The processing...

Comparison of High Frequency AC-DC Voltage Transfer Standards at NRC, VSL, PTB, and NIST

May 1, 2000

Author(s)

Piotr S. Filipski, C. J. van Mullem, D. Janik, M. Klonz, Joseph R. Kinard Jr., Thomas E. Lipe Jr., Bryan C. Waltrip

The paper summarizes results of two international comparisons relating TVC RF voltage transfer standards of the National Research Council of Canada (NRC) to the...

Characterization of Four-Terminal-Pair Resistance Standards: A Comparison of Measurements and Theory

May 1, 2000

Author(s)

Randolph Elmquist, Anne-Marie Jeffery, Dean G. Jarrett

Coaxial straight-wire resistance standards with calculable frequency dependence have been used to tie alternating-current (ac) measurements to direct-current...

International Comparison of 50/60 Hz Power (1996-1999)

May 1, 2000

Author(s)

Nile M. Oldham, Thomas L. Nelson, R. Bergeest, R. Carranza, M. Gibbes, K Jones, Gregory Kyriazis, H. Laiz, L. Liu, Z. Lu, U. Pogliano, K. E. Rydler, E. Shapiro, E. So, M. Temba, P. Wright

An International Comparison of 50/60 Hz Power is described. The traveling standard was an electronic power transducer which was tested at 120 volts, 5 amperes...

Non-Iterative Waveform Deconvolution Using Analytic Reconstruction Filters with Time-Domain Weighting

May 1, 2000

Author(s)

Sandip Roy, T. M. Souders

A new deconvolution approach is described for reconstructing fast step-like or impulsive signals that have been measured with a sampling oscilloscope for which...

A Multi-Frequency 4-Terminal-Pair AC Bridge

May 1, 2000

Author(s)

Anne-Marie Jeffery, John Q. Shields, Scott H. Shields

A 4-terminal-pair ac bridge, capable of a relative uncertainty of 2 x 10^-9^, has been constructed at NIST. The bridge is a multi-ratio bridge (10:1, 2:1 and 1...

The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method

May 1, 2000

Author(s)

Donald R. Larson, Nicholas Paulter

The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset...

4 Amp 4H-SiC JBD Diodes

May 1, 2000

Author(s)

Ranbir Singh, Sei-Hyung Ryu, M. Palmer, Allen R. Hefner Jr., Jih-Sheng Lai

Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA)

May 1, 2000

Author(s)

Yi-hua D. Tang, W. Wyatt Miller

Two JVS systems operated at the NIST and LMA were compared by using four traveling Zener standards. A MAP protocol was adopted for the comparison. The mean...

Imaging of Composite Defects and Damage Using Optical Coherence Tomography

May 1, 2000

Author(s)

Joy Dunkers, M J. Everett, D P. Sanders, Donald L. Hunston

The Composites Group at the National Institute of Standards and Technology has found optical coherence tomography (OCT) to be a powerful tool for non...

Effect of Water Exposure Cycles on Physical Properties of a Partical-Filled, Epoxy-Based Adhesive

May 1, 2000

Author(s)

Martin Chiang, M Fernandez-Garcia, E M. Yorkgitis

The effect of cyclic hygrothermal aging on a particle-filled, epoxy-based adhesive was studied using a sequence of water absorption, desorption and reabsorption...

A Test Method for Assessing Interfacial Shear Strength in Composites

May 1, 2000

Author(s)

Gale A. Holmes, Donald L. Hunston, Walter G. McDonough, R C. Peterson

Two of the critical factors controlling the long-term performance and durability of composites in structural applications is the fiber-matrix interfacial shear...

Comparison Between the SNS and SIS Josephson Voltage Standards at NIST

May 1, 2000

Author(s)

Blaise Jeanneret, Alain Rufenacht, Charles J. Burroughs

International Comparison GT/RF 86-1 Electrical Field Strengths, 27 MHz to 10 GHz

May 1, 2000

Author(s)

Motohisa Kanda, Dennis G. Camell, J. Achkar, M. Alexander, Jan P. deVreede, Michele Borsero, H. Yajima, N. S. Chung, H. Trzaska

This paper descirbes the international comparison of electric field strength measurements at frequencies between 27 MHz and 10 GHz (GT/RF 86-1). The...

Complex Permittivity Measurements of Single-Crystal and Ceramic Strontium Titanate at Microwave Frequencies and Cryogenic Temperatures

May 1, 2000

Author(s)

Jerzy Krupka, James R. Baker-Jarvis, Richard G. Geyer

The permittivity and dielectric loss tangent of bulk strontium titanate were measured from 4 to 3pp K, at frequencies from 400 MHz to 3.8 GHz, using a...

ATLAS: A Flexible and Extensible Architecture for Linguistic Annotation

May 1, 2000

Author(s)

S Bird, D Day, John S. Garofolo, J Henderson, Christophe Laprun, M Liberman

We describe a formal model for annotating linguistic artifacts, from which we derive an application programming interface (API) to a suite of tools for...

Long-Period Gratings as Flow Sensors for Liquid-Composite Molding

May 1, 2000

Author(s)

S R. Kueh, Richard~undefined~undefined~undefined~undefined~undefined Parnas, Joy Dunkers, S G. Advanti, P S. Furrows, M E. Jones, T A. Bailey

One of the most important issues in liquid composite molding (LCM) is the complete saturation of the preform by the resin to eliminate voids or dry spots in the...

Standard Reference Materials: Non-Newtonian Fluids for Rheological Measurements

May 1, 2000

Author(s)

Carl R. Schultesiz, G B. McKenna

NIST develops Standard Reference Materials for calibration, quality assurance and research into improved measurements. Two fluid standards are being developed...

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