Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Calibration of Lightpipe Radiation Thermometers in a RTP Tool at 1000 C

Published

Author(s)

Kenneth G. Kreider, D P. DeWitt, Christopher W. Meyer, Vincent P. Scheuerman

Abstract

We are developing an instrumented calibration wafer for radiometric temperature measurements in rapid thermal processing (RTP) that uses Pt/Pd wire and noble metal thin-film thermocouples that are welded to thin-film pads of Pt. The Pt/Pd wire thermocouples determine the weld junction temperature within a standard uncertainty of 0.1 C at 1000 C. Thin films of noble metals including Pd, Pt, Rh, Ru, and Ir reach from the wire junction to locations near the radiometric target to establish the surface temperature of the wafer at the target. These thin-film thermocouples (TFTCs) are calibrated at NIST and have a standard uncertainty of 0.3 C for differential temperature measurements of up to 10 C at temperatures up to 1000 C on the wafer. In the past we have reported on TFTCs that were useful up to 900 C, but problems of SiO2 electrical conductivity, coalescence of the thin films, and oxidation of the films have precluded their use at 1000 C.We now report solutions to those problems while maintaining a standard uncertainty of 0.4 C for the surface temperature measurement. We have found that it was necessary to increase the thickness of the thermal SiO2 to 690 nm from the 310 nm previously used. In order to improve the stability of the Pt against coalescence and pore growth, we have made the traces thicker (>1 m) and covered them with SiO2. We can fabricate the TFTCs from the more refractory noble metals (Rh, Ru, and Ir) but an increase in the temperature measurement uncertainty is caused by the smaller Seebeck coefficients of these combinations cause an increase in the temperature measurement uncertainty because of their smaller Seebeck coefficients. We use the NIST Rh/Pt thin-film thermocouple wafer with Pt/Pd wire thermocouples in the NIST RTP test bed to illustrate a method of in situ calibration. The 0.4 C standard uncertainty combined with the uncertainty of temperature difference between the locations of the thermocouple junction and radiometric measurements led to a calibration uncertainty of 2 C for RTP light pipe radiation thermometers in the range of 700 C and 1000 C.
Proceedings Title
8th International Symposium on Advanced Thermal Processing of Semiconductors
Conference Dates
April 14-16, 2000
Conference Title
International Symposium on Advanced Thermal Processing of Semiconductors

Keywords

Calibration wafer, Palladium, Platinum, Radiation Thermometers, Rapid Thermal Processing, Rhodium, Thermocouples, Thin films

Citation

Kreider, K. , DeWitt, D. , Meyer, C. and Scheuerman, V. (2000), Calibration of Lightpipe Radiation Thermometers in a RTP Tool at 1000 C, 8th International Symposium on Advanced Thermal Processing of Semiconductors (Accessed June 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2000, Updated February 17, 2017