Reymann, D.
, Witt, T.
, Vrabcek, P.
, Tang, Y.
, Hamilton, C.
, Katkov, A.
, Jeanneret, B.
and Power, O.
(2000),
Recent Developments in BIPM Voltage Standard Comparisons, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12898
(Accessed October 16, 2025)
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Recent Developments in BIPM Voltage Standard Comparisons
Published
Author(s)
D. Reymann, Thomas J. Witt, P. Vrabcek, , , A. S. Katkov, Blaise Jeanneret, O. Power
Abstract
The BIPM carries out a number of comparisons of DC voltage standards with National Metrology Institutes. These take the form of on-site comparisons of Josephson standards or bilateral comparisons using traveling standards based on Zener diodes. This paper describes some of the new procedures used in both types of comparisons and presents some results of five recent BIPM key comparisons.Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
May 14-19, 2000
Conference Location
Sydney, 1, AS
Pub Type
Conferences
Download Paper
Keywords
voltage standards, international key comparisons
Citation
Issues
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Created April 30, 2000, Updated October 12, 2021