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Measurement of the Frequency Dependence of a Single-Electron Tunneling Capacitance Standard

Published

Author(s)

Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman

Abstract

In the context of a proposed new capacitance standard based on counting electrons, we discuss a method to investigate its frequency dependence. We describe measurements of this frequency dependence using a technique that involves the same single-electron tunneling (SET) devices used in the capacitance standard.
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Issue
22
Conference Dates
May 14-19, 2000
Conference Location
Sydney, AS

Keywords

capacitance standard, frequency dependence, single electron tunneling

Citation

Eichenberger, A. , Keller, M. , Martinis, J. and Zimmerman, N. (2000), Measurement of the Frequency Dependence of a Single-Electron Tunneling Capacitance Standard, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=17794 (Accessed May 18, 2024)

Issues

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Created April 30, 2000, Updated October 12, 2021