Eichenberger, A.
, Keller, M.
, Martinis, J.
and Zimmerman, N.
(2000),
Measurement of the Frequency Dependence of a Single-Electron Tunneling Capacitance Standard, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=17794
(Accessed December 14, 2024)
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Measurement of the Frequency Dependence of a Single-Electron Tunneling Capacitance Standard
Published
Author(s)
Ali L. Eichenberger, , ,
Abstract
In the context of a proposed new capacitance standard based on counting electrons, we discuss a method to investigate its frequency dependence. We describe measurements of this frequency dependence using a technique that involves the same single-electron tunneling (SET) devices used in the capacitance standard.Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Issue
22
Conference Dates
May 14-19, 2000
Conference Location
Sydney, AS
Pub Type
Conferences
Download Paper
Keywords
capacitance standard, frequency dependence, single electron tunneling
Citation
Issues
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Created April 30, 2000, Updated October 12, 2021