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PUBLICATIONS

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

Published

Author(s)

Michael Kennedy, Matthew A. Davies, Howard W. Yoon, Timothy J. Burns

Abstract

A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction-limited thermal-imaging microscope to measure the spatially-resolved temperatures during the machining of an AISI 1045 steel with a tungsten-carbide tool bit. The microscope has a target area of 0.5 mm x 0.5 mm square region with a
Volume
4020
Conference Dates
April 24-27, 2000
Conference Location
Orlando, FL
Conference Title
International Conference on Thermal Sensing and Imaging Diagnostic Applications: Thermosense XXII
Pub Type
Conferences

Keywords

calibration, machining, microscopy, thermal imaging, tool-chip interface
Process measurement and control

Citation

Kennedy, M. , Davies, M. , Yoon, H. and Burns, T. (2000), Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining, International Conference on Thermal Sensing and Imaging Diagnostic Applications: Thermosense XXII, Orlando, FL (Accessed September 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2000, Updated February 19, 2017