NIST Facility for Spectral Calibration of Detectors: Calibration of Arsenic-Doped Silicon-Blocked Impurity Band Detectors

Published

April 1, 2000

Author(s)

Adriaan C. Carter, Steven R. Lorentz, Timothy M. Jung, Beverly Klemme, Raju V. Datla

Abstract

The capability of the Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology to spectrally calibrate infrared detectors was demonstrated with the spectral calibration of arsenic doped silicon blocked impurity band (BIB) detectors. The BIB detectors were calibrated over the 2 mm to 30 mm range, using light from a monochromator with a nominal 2 % bandwidth. The calibrations contained less than +/- 1 % standard component of random noise uncertainty, and there was about a +/- 5% standard component of uncertainty arising from systematic effects that will be discussed in detail. The calibrations were performed in ultra-high vacuum in a 20 K background environment by making direct intercomparisons between the power measured by an absolute cryogenic radiometer and the response measured by a detector irradiated by the same beam. A detailed description of measurement methodology and system apparatus is given. Detector linearity and uniformity are also discussed. The LBIR facility can now provide calibrated BIB detectors as transfer standards as well as evaluate and calibrate customers' large area detectors and detector arrays provided the detectors stay within certain physical limitations.

Proceedings Title

Infrared Detectors and Focal Plane Arrays, Conference I 6th | | SPIE

Volume

4028

Conference Dates

April 25-27, 2000

Conference Title

Proceedings of SPIE--the International Society for Optical Engineering

Pub Type

Conferences

Keywords

arsenic doped silicon, calibration, cryogenic, detectors, infrared, NIST, spectral

Citation

Carter, A. , Lorentz, S. , Jung, T. , Klemme, B. and Datla, R. (2000), NIST Facility for Spectral Calibration of Detectors: Calibration of Arsenic-Doped Silicon-Blocked Impurity Band Detectors, Infrared Detectors and Focal Plane Arrays, Conference I 6th | | SPIE (Accessed April 18, 2024)