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We show that the dispersion of optical components can be determined from a single low-coherence interferometric measurement. This technique can be applied to...
A new system to characterize the magnitude and phase characteristics of 1 pF to 1 uF capacitance standards over the 50 Hz to 100 kHz frequency range is...
X Huang, H. Yu, Jih-Sheng Lai, Allen R. Hefner Jr., David W. Berning
The super junction (SJ) MOSFET exhibits conduction and switching properties similar to those of conventional power MOSFETs. In this paper we investigate...
Ty R. McNutt, Allen R. Hefner Jr., A. Montooth, J L. Duliere, David W. Berning, Ranbir Singh
Dynamic compact electrothermal models are developed for Silicon Carbide Power diodes. Model parameters are extracted and model results are presented for both...
Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation...
The accuracy of tristimulus colorimeters can be increased by using detector standards instead of traditional lamp standards for calibration. After high accuracy...
We need to facilitate a change in user perception of security from a hindrance to an essential revenue generator and mission enabler. The Common Criteria...
Ranbir Singh, Allen R. Hefner Jr., David W. Berning, M. Palmer
This paper reports in detail, the design, a manufactuable fabrication process, and high temperature characteristics of a 4H-SiC rectifier with a 5 kV, 20 A...
Christopher J. Evans, Angela Davies, Tony L. Schmitz, R E. Parks
The basic goal of the Advanced Optics Metrology program at NIST''s Manufacturing Engineering Laboratory is to help industry ensure that their measurement...
The National Bureau of Standards (NBS) was formed by Congress 100 years ago. The early Bureau was a small organization, founded at the beginning of the age of...
William L. Grosshandler, Anthony P. Hamins, Jiann C. Yang, Kevin B. McGrattan, Cary Presser
A three-year research effort has been conducted as part of the Next Generation Program (NGP) to develop a laboratory screening device suitable for predicting...
The NIST Refrigerants Program was initiated in 1981 under the sponsorship of the Electric Power Research Institute with the intent to determine if a zeotropic...
Paul E. Stutzman, David S. Bright, Edward J. Garboczi
Concrete petrography is used to assess damaged concrete in order to determine the probable mechanism of damage. However, using traditional petographic analyses...
In order to identify limitations on the use of Pt/Pd thermocouples as high-accuracy thermometers, we have studied the change in thermocouple emf at the Al and...
Six new Hg triple-point (TP) cells (234.3156 K) were manufactured in the NIST PRT Laboratory for use in the realization of the International Temperature Scale...
As part of a research project for the Combined Calibration Group (CCG) of the U.S. Armed Forces, three rugged fixed-point cells were developed for use in dry...
Christopher W. Meyer, D P. DeWitt, Kenneth G. Kreider, Francis J. Lovas, Benjamin K. Tsai
Light-pipe radiation thermometers (LPRTs) are the sensor system of choice in RTP tools. They can be calibrated against blackbodies with an uncertainty (k=1)...
The NIST Low Frost-point Humidity Generator (LFPG) produces water vapor gas mixtures with mole fractions from approximately 5 nmol/mol to 4 mmol/mol for...
Preliminary results are reported on the non-uniqueness of the ITS-90 using high temperature SPRTs (HTSPRTs) in the range 660 C to 962 C. To achieve temperature...
In interlaboratory comparisons, laboratories sometimes use a transfer instrument to realize the value of a laboratory standard to compare the relative biases of...
The private and public sectors depend heavily upon information technology (IT) systems to perform essential, mission-critical functions. As technology improves...
George D. Quinn, K Xu, R J. Gettings, J A. Salem, J Swab
New Standard Reference Material (SRM) 2100 is the first reference material in the world for the property fracture toughness for any class material. The SRM is...
We perform simulations of filled and nanofilled polymers using a combination of molecular and mesoscale simulation techniques. Molecular dynamics simulations...
Low expansion materials used in electronic devices require a tool that has a commensurate resolution for measuring deformation, such as the atomic force or...
Kalman D. Migler, C Lavallee, M P. Dillon, S S. Woods, C L. Gettinger
Flow visualization was used to understand how polymer-processing additives (PPA) eliminate sharkskin in linear low-density polyethylene (LLDPE). A sapphire...