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Conferences

Atomic Spectroscopy at NIST 2001

Author(s)
Joseph Reader
The program in atomic spectroscopy at NIST continues to provide accurate reference data on spectral lines and energy levels for a wide variety of important...

History of the Symposium on Thermophysical Properties

Author(s)
William M. Haynes, Jan V. Sengers, R. T. Jacobsen, Daniel G. Friend
The Symposium on Thermophysical Properties represents a series of conferences that started in 1959 at Purdue University, which at the that time was the home of...

Architectures in an XML World

Author(s)
Joshua Lubell
XML[Extensible Markup Language] developers today have at their disposal a variety of tools for achieving schema reuse. An often-overlooked reuse method is the...

X-Ray Metrology by Diffraction and Reflectivity

Author(s)
D K. Bowen, R Deslattes
X-ray methods can provide measurements that, for certain parameters of great technological importance, are the most accurate and sensitive available. Their...

AlGaN Schottky Diodes for Short-Wavelength UV Applications

Author(s)
P P. Chow, J J. Klaassen, Robert E. Vest, J M. VanHove, A Wowchak, C Polley
High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors...

Quantum Gates Using Motional States in an Optical Lattice

Author(s)
E Charron, Eite Tiesinga, F H. Mies, Carl J. Williams
We Study an implementation of a two-qubit universal quantum gate with neutral 87Rb atoms trapped in a far-detuned two-color optical lattice. The qubit states...

High Performance Transition-Edge-Sensor Based Detectors

Author(s)
Gene C. Hilton, Steven Deiker, Kent D. Irwin, Sae Woo Nam, John M. Martinis, David A. Wollman
High performance detectors utilizing transition-edge sensors (TES) have been demonstrated for photon energies ranging from the infrared to the x-ray. In the...

Broadband Josephson Voltage Standards

Author(s)
Clark A. Hamilton, Samuel P. Benz
A Josephson junction is a perfect frequency to voltage converter, that is, V=f/K j where K j = 483597.9 GHz/V. This unique property has been used to convert a...

Challenges of High-[kappa] Gate Dielectrics for Future MOS Devices

Author(s)
John S. Suehle, Eric M. Vogel, Monica D. Edelstein, Curt A. Richter, Nhan Van Nguyen, Igor Levin, Debra Kaiser, Hanchang F. Wu, J B. Bernstein
As the feature sizes of complementary metal-oxide-semiconductor (CMOS) devices are scaled downward, the gate dielectric thickness must also decrease to maintain...

Compressive Strengthening of Sapphire by Neutron Irradiation

Author(s)
T M. Regan, D C. Harris, R M. Stroud, J R. White, D W. Blodgett, K C. Baldwin, J A. Miragliotta, M E. Thomas, M J. Linevsky, J W. Giles, T A. Kennedy, M Fatemi, David R. Black
Neutron irradiation of sapphire with 1 1022(=1 MeV)/m2 increases the c-axis compressive strength by a factor of 3 at 600 C. The mechanism of strength...

The Impact-Echo Method: An Overview

Author(s)
Nicholas J. Carino
The impact-echo method is a technique for flaw detection in concrete. It is based on monitoring the surface motion resulting from a short-duration mechanical...

The Maturity Method: From Theory to Application

Author(s)
Nicholas J. Carino, Hai S. Lew
The maturity method is a technique to account for the combined effects of time and temperature on the strength development of concrete. The method provides a...
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