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Conferences

The Electronic Kilogram

Author(s)
Michael H. Kelley
The kilogram is the only remaining base unit in the International System of Units (SI) whose definition is based on a single physical artifact rather than on...

A New Stable Speed Test Apparatus for Milling

Author(s)
J P. Snyder, Jon R. Pratt, Matthew A. Davies, S J. Smith
This paper describes a new device that uses a non-contact force actuator in conjunction with spindle rotation to produce an impulsive periodic driving force on...

Sensor Networking and Interface Standardization

Author(s)
Kang B. Lee
Sensors are used in various industries, ranging from aerospace, automotive, biomedicine, building, industrial automation, manufacturing, and process control to...

Large Anisotropy Via Oblique Sputtering of Ta Underlayers

Author(s)
John E. Bonevich, Robert D. McMichael, Chang H. Lee, P J. Chen, W Wyatt Miller, William F. Egelhoff Jr.
Anisotropy fields in excess of 120 KA/m (1500 Oe) have been produced in 3 nm to 5 nm thick polycrystalline films of Co by oblique sputtering of Ta underlayers...

Luminous Flux Calibrations of LEDs at NIST

Author(s)
Carl C. Miller, Yoshihiro Ohno
The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere...

Impact of Model-Driven Architecture

Author(s)
David W. Flater
The Object Management Group (the consortium that issues the Common Object Request Broker Architecture and Unified Modeling Language standards) is making the...

Towards a Traceable Nanoscale Force Standard

Author(s)
Jon R. Pratt, David B. Newell, Edwin R. Williams, Douglas T. Smith, John A. Kramar
The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between...

A Method to Compare Vector Nonlinear Network Analyzers

Author(s)
Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta
We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response...

Calibrating Electro-Optic Sampling Systems

Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We apply frequency-domain impedance mismatch corrections to a temporal electro-optic sampling system. We identify and evaluate additional sources of measurement...

Reconfigurable Machine Controllers using the OMAC API

Author(s)
S Birla, D -. Faulkner, John L. Michaloski, S -. Sorenson, G Weinert, James H. Yen
With enterprises facing tremendous time-to-market pressures, manufacturing systems must be implemented quickly and modified easily. The ability of the open...
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