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Compensation for Stray Light in Projection Display Metrology

Published

Author(s)

Paul A. Boynton, Edward F. Kelley

Abstract

Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation. However, not everyone has access to such a facility, and not always will the light-measuring devices necessarily provide accurate information. Simple tools are discussed that address some of these concerns.
Proceedings Title
Tech. Dig., Society for Information Display International Symposium
Volume
XXXII
Conference Dates
June 3-8, 2001
Conference Location
San Jose, CA, USA

Keywords

contrast measurements, projection display measurements, projection mask, stray light

Citation

Boynton, P. and Kelley, E. (2001), Compensation for Stray Light in Projection Display Metrology, Tech. Dig., Society for Information Display International Symposium , San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=17371 (Accessed June 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 29, 2001, Updated October 12, 2021