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Conferences

Software Assurances Metrics and Tool Evaluation

Author(s)
Michael Sindelar
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

Deploying Wireless PANs and LANs for eHealth

Author(s)
Nada T. Golmie
We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric...

A Review of Current Research Work on BGP Security

Author(s)
Kotikalapudi Sriram
We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric...

Integrity Checking of DNS Zone File Data Using XSLT

Author(s)
Ramaswamy Chandramouli, Scott W. Rose
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the...

Evaluation of Indoor Localization Techniques

Author(s)
Camillo Gentile, Kamran Sayrafian, Nader Moayeri
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the...

Data Exchange for Machine Shop Simulation

Author(s)
Yung-Tsun Lee, Yan Luo
Manufacturing simulation systems normally provide inter-faces for data import and export using proprietary formats. Dependent data interfaces limit simulation...

Towards Semantic-Based Supply Chain Integration

Author(s)
Nenad Ivezic, Nenad Anicic, Albert T. Jones, Zuran Marjanovic
We describe a novel Enterprise Application Integration (EAI) architecture based on existing B2B standards. We show how such an EAI architecture can use...

A Framework For Autonomy Levels For Unmanned Systems (ALFUS)

Author(s)
Hui-Min Huang, K Pavek, B Novak, James S. Albus, Elena R. Messina
We describe the construct of the framework for the Autonomy Levels of Unmanned Systems (ALFUS), including the ongoing development effort undertaken by the Ad...

Quantum Control, Quantum Information Processing, and Quantum-Limited Metrology With Trapped Ions

Author(s)
David J. Wineland, Dietrich G. Leibfried, Murray D. Barrett, A. Ben-Kish, James C. Bergquist, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, B. L. DeMarco, David Hume, Wayne M. Itano, M J. Jensen, John D. Jost, Emanuel H. Knill, Jeroen Koelemeij, C. Langer, Windell Oskay, R Ozeri, Rainer Reichle, Till P. Rosenband, Tobias Schaetz, Piet Schmidt, Signe Seidelin
We briefly discuss recent experiments on quantum informaiton processing using trapped ions at NIST. A central theme of this work has been to increase our...

Phase Noise Effects in Sampling Microwave Measurement Systems

Author(s)
Giovanni Loglio, Jeffrey Jargon, Donald C. DeGroot, Zoya Popovic
For the purpose of bounding sources of measurement uncertainty, we examine the effects of phase noise on measured wave-variables using sampling, downconvertor...

On Peculiarities of S-Parameter Measurements

Author(s)
Yves Rolain, Wendy Van Moer, Jeffrey Jargon, Donald C. DeGroot
Measured S-parameters are a key factor for many measurement/modeling applications. Experience teaches that quantities that are derived from the measurements can...

Wavelength References for Optical Interferometry

Author(s)
Richard W. Fox, Leo W. Hollberg
We are exploring air wavelength references useful for interferometry. Femtosecond comb frequency measurements determine mode wavelengths of a stable optical...

Femtosecond laser frequency combs: optical synthesizers for precision spectroscopy and frequency metrology

Author(s)
Scott A. Diddams, A Bartels, Tara M. Fortier, Eugene N. Ivanov, Kyoungsik Kim, John J. McFerran, Windell Oskay, G Wilpers, Christopher W. Oates, James C. Bergquist, Leo W. Hollberg, Vladislav Gerginov, C E. Tanner
A femtosecond laser frequency comb (FLFC) is the broadband (octave-spanning) evenly-spaced array of optical frequencies that is present in the output of a...

The NIST Kolsky Bar Data Processing System

Author(s)
Eric P. Whitenton
A new dynamic testing apparatus has been built at the National Institute of Standards and Technology (NIST) to measure dynamic material properties for machining...
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