Display Metrology Concerns International Standards

Published

May 11, 2005

Author(s)

Paul A. Boynton

Abstract

An alphabet soup of display standards addresses the various needs and applications of display manufactures, integrators, and users. Unfortunately, when it comes to display metrology, many of these standards suffer. Assumptions are made about the instrumentation involved. There are many pitfalls that can deceive the unwary into creating unrealistic expectations and poor conjectures about their measurement results and thus the performance of their displays. Many of these dangers involve limitations of the measuring instrumentation used in display characterization: spectral mismatch, non-linearity of the detector, veiling glare and other forms of stray-light corruption, and many other sources. Yet once the capabilities of the instrumentation are understood, meaningful decisions about the appropriateness of the instrument can be made, potential errors can be identified, and solutions implemented if applicable. Diagnostics and other tools can help facilities evaluate their measurement capabilities and limitations, instill confidence in their ability to accurately measure display quality, and to suggest means for improving performance. However, even if the instrumentation has been well characterized and well understood, the methodology itself can create many problems. Procedures can be vague, with important details left out. They may not be reproducible from day to day, between separate facilities, or among different operators. They may be technology dependent, either upon the display under test or the measurement instrument used. They may be sensitive to small changes in the measurement apparatus. Choosing the right methodologies (one that is robust, repeatable, unambiguous and extendible) will ensure that the characterization of the display is an accurate and meaningful one A review of some of the standards activities will be presented, and some examples of how standards are addressing these metrology issues will be discussed.

Proceedings Title

Proc., CORM

Conference Dates

May 11-13, 2005

Conference Location

Boulder, CO

Conference Title

Council for Optical Radiation Measurements Conference

Pub Type

Conferences

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Keywords

display metrology, display standards, international standards

Citation

Boynton, P. (2005), Display Metrology Concerns International Standards, Proc., CORM, Boulder, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32007 (Accessed April 17, 2024)