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Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films

Published

Author(s)

Vivek M. Prabhu, B D. Vogt, Wen-Li Wu, Jack F. Douglas, Eric K. Lin, Sushil K. Satija, D M. Goldfarb, H Ito

Abstract

A depth profile of the counterion concentration within thin polyelectrolyte films was measured in-situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find a substantial counterion depletion near the substrate and an enrichment near the periphery of the film extending into the solution. The film expansion extent follows a linear dependence with the segmental degree of ionization. These observations challenge our understanding of the charge distribution and swelling response in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.
Conference Dates
May 20-22, 2005
Conference Location
Kyoto,
Conference Title
Abstract Book : the 3rd Kips-Nist Joint Symposium on Polymer Science- 3rd KIPS-NIST JOINT SYMPOSIUM ON POLYMER SCIENCE.

Keywords

Electronic Materials, Lithography, Reflectivity, Thin Films, developer, dissolution, neutron reflectivity, photoresist, polyelectrolyte, swelling

Citation

Prabhu, V. , Vogt, B. , Wu, W. , Douglas, J. , Lin, E. , Satija, S. , Goldfarb, D. and Ito, H. (2005), Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films, Abstract Book : the 3rd Kips-Nist Joint Symposium on Polymer Science- 3rd KIPS-NIST JOINT SYMPOSIUM ON POLYMER SCIENCE., Kyoto, , [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854005 (Accessed June 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 20, 2005, Updated February 19, 2017