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Conferences

Active Light-Shift Stabilization in Modulated CPT Clocks

Author(s)
V Shah, P Schwindt, Vladislav Gerginov, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching
We demonstrate a simple technique to significantly improve the long-term frequency stability in atomic clocks vased on coherent population trapping (CPT). In

A Local Oscillator for Chip-Scale Atomic Clocks at NIST

Author(s)
Alan Brannon, J Breitbarth, Z Popovic, Vladislav Gerginov, V Shah, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching
We report the first local oscillator (LO) demonstrating viability in terms of performance, size, and power, for chip scale atomic clocks (CSAC) at the National

RFID 101

Author(s)
Leonard E. Miller
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the

Software Assurances Metrics and Tool Evaluation

Author(s)
Paul E. Black
NIST is starting two ambitious projects to (1) develop a taxonomy of software security flaws and vulnerabilities, (2) develop a taxonomy of software assurance

Development of Traceable Small Force Standards

Author(s)
Gordon A. Shaw, Jon R. Pratt
Although instrumented indentation and atomic forcve microscope (AFM) are utilized extensively for the measurement of forces in the piconewton to millinewton

Analysis of the Step-Diagonal Test

Author(s)
Johannes A. Soons
The step-diagonal test modifies the diagonal displacement test for machine tool performance evaluation by executing a diagonal as a sequence of single-axis

Development of Multiple Beam Optical Tweezers

Author(s)
Dongjin Lee, Thomas W. LeBrun, Arvind Balijepalli, Jason J. Gorman, Cedric V. Gagnon, Daehie Hong, Esther H. Chang
This paper presents the design of a multiple beam optical tweezers instrument used for manipulating micro/nano-sized components. The basic equations used in

Critical Dimension Reference Features with Sub-Five Nanometer Uncertainty

Author(s)
Michael W. Cresswell, Ronald G. Dixson, William F. Guthrie, Richard A. Allen, Christine E. Murabito, Brandon Park, Joaquin (. Martinez, Amy Hunt
The implementation of a new type of HRTEM-imaging (High-Resolution Transmission Electron Microscopy) test structure, and the use of CD-AFM (CD-Atomic Force
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