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Conferences

Dynamic Modeling and Vibration Analysis of a UHV Scanning Tunneling

Author(s)
Sumanth B. Chikkamaranahalli, R. R. Vallance, Bradley N. Damazo, Richard M. Silver, James D. Gilsinn
Techniques based on scanning probe microscopy (SPM) are used to fabricate surface structures with dimensions ranging from 10 - 100mm. These structures have been...

Chip-Scale Atomic Clocks at NIST

Author(s)
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, Hugh Robinson, P Schwindt, V Shah, Vladislav Gerginov, Leo W. Hollberg
We describe recent efforts to develop microfabricated atomic frequency references capable of supporting a wide variety of commercial and military systems such...

Uncertainties in Spherical Near-Field Antenna Measurements

Author(s)
Michael H. Francis, Ronald C. Wittmann, Jin-Seob Kang
A general approach is presented for estimating uncertainties in far-field parameters obtained from spherical near-field antenna measurements. The error is...

New NIST Reference Goniospectrometer

Author(s)
Gael Obein, Robert R. Bousquet, Maria E. Nadal
Coatings can be classified by either their appearance, such as glitter, or by their function, such as corrosion protection. However, pigments are currently...

A Fiber Probe for CMM Measurements of Small Features

Author(s)
Jack A. Stone Jr., Balasubramanian Muralikrishnan, John R. Stoup
We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement...

Microfluidic Interfacial Tensiometry

Author(s)
Steven D. Hudson, J Cabral, Wenhua Zhang, Jai A. Pathak, Kathryn L. Beers
Immiscible fluids find diverse applications, yet their interfacial tension σ remains a fundamental property that governs their performance. Therefore, accurate...

Microfabricated Atomic Clocks and Magnetometers

Author(s)
Svenja A. Knappe, P Schwindt, Vladislav Gerginov, V Shah, Hugh Robinson
We describe recent research at NIST directed towards the development of microfabricated atomic clocks and magnetometers based on coherent population trapping...

NIST Realization of the ITS-90 Gallium Fixed Point

Author(s)
Gregory F. Strouse
As defined by the International Temperature Scale of 1990 (ITS-90), the gallium melting-point cell (29.7646 C) is used in the calibration of standard platinum...

Stabilization of SPRTs for ITS-90 Calibrations

Author(s)
Dennis B. Minor, Gregory F. Strouse
At the National Institute of Standards and Technology (NIST), the ITS-90 calibration of standard platinum resistance thermometers (SPRTs) is performed in the...
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