Vogel, E.
(2005),
Characterization of Electrically Active Defects in High-k Gate Dielectrics Using Charge Pumping, Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectrics, St. Petersburg, RS
(Accessed December 6, 2023)
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Characterization of Electrically Active Defects in High-k Gate Dielectrics Using Charge Pumping
Published
Author(s)
Proceedings Title
Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectrics
Conference Dates
July 11-14, 2005
Conference Location
St. Petersburg, RS
Conference Title
NATO Advanced Research Workshop on Defects in Advanced High-k Dielectrics
Pub Type
Conferences
Citation
Created July 14, 2005, Updated January 27, 2020