@conference{192921,
  author = {Eric Vogel},
  title = {Characterization of Electrically Active Defects in High-k Gate Dielectrics Using Charge Pumping},
  year = {2005},
  month = {2005-07-14},
  publisher = {Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectrics, St. Petersburg, RS},
  language = {en},
}