TY  - CONF
AU  - Eric Vogel
C2  - Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectrics, St. Petersburg, RS
DA  - 2005-07-14
LA  - en
PB  - Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectrics, St. Petersburg, RS
PY  - 2005
TI  - Characterization of Electrically Active Defects in High-k Gate Dielectrics Using Charge Pumping
ER  -