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Conferences

Calibrated Broadband Electrical Characterization of Nanowires

June 8, 2008

Author(s)

Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos

A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as...

Permittivity and Permeability and the Basis of Effective Parameters

June 8, 2008

Author(s)

James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle

The concepts of effective permittivity and permeability are used throughout the literature to describe both highly heterogeneous materials, inhomogeneous...

Mixed Analog-Digital Instrumentation for Software-Defined-Radio Characterization

June 5, 2008

Author(s)

Catherine A. Remley, Nuno Carvalho, Pedro Cruz, Kevin Gard

This paper presents a new type of analog-digital mixed-domain instrument that is specially tailored for software defined radio characterization. The instrument...

Controlled Encapsulation of a Hydrophilic Drug Simulant in Nano-Liposomes Using Continuous Flow Microfluidics

June 4, 2008

Author(s)

Andreas Jahn, Joseph E. Reiner, Wyatt N. Vreeland, Don DeVoe, Laurie E. Locascio, Michael Gaitan

A new method to tailor the size and size distribution of nanometer scale liposomes and control loading of liposomes with a model drug in a continuous-flow...

Policy Specification and Enforcement for Smart ID Cards Deployment

June 3, 2008

Author(s)

Ramaswamy Chandramouli

Deployment of Smart Cards for Identity Verification requires collection of credentials and provisioning of credentials from and to heterogeneous and sometimes...

Fabry-Perot temperature dependence and surface-mounted optical cavities

June 2, 2008

Author(s)

Richard W. Fox

Factors that contribute to the resonance temperature dependence of low-expansion optical cavities are discussed, including deformation at the cavity ends due to...

A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy

June 2, 2008

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International...

Reducing Thermal Noise in Molecular Force Spectroscopy

June 2, 2008

Author(s)

Gordon A. Shaw

Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules. The precision determination of these properties requires...

Can TCP Metastability Explain Cascading Failures and Justify Flow Admission Control in the Internet?

June 2, 2008

Author(s)

Vladimir V. Marbukh

This paper discusses implications of possible metastability of TCP-type fair bandwidth sharing under random flow arrivals/departures for understanding and...

Radio Communications for Emergency Responders in High-Multipath Outdoor Environments

June 2, 2008

Author(s)

Catherine A. Remley, Galen H. Koepke, Christopher L. Holloway, Chriss A. Grosvenor, Dennis G. Camell

We present measurement data to support technology and standards development for broadband, digitally modulated radio communications used by emergency responders...

Lateral force cantilever for precise atomic force microscope friction measurements

June 2, 2008

Author(s)

Mark Reitsma, Richard S. Gates, Robert F. Cook

We present a microfabricated atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction...

High-Voltage Isolated Gate Drive Circuit for 10 kV, 100 A SiC MOSFET/JBS Power Modules

June 2, 2008

Author(s)

David W. Berning, Tam H. Duong, Jose M. Ortiz, Angel Rivera, Allen R. Hefner Jr.

A high-current, high-voltage-isolated gate drive circuit developed for characterization of high-voltage, high-frequency 10 kV, 100 A SiC MOSFET/JBS half-bridge...

Magneto-resistive Field Mapping of Analog Audio Tapes for Forensics Imaging

June 2, 2008

Author(s)

David P. Pappas

Magneto-resistive imaging of cassette tapes for forensic analysis applications is presented. Sample tapes were recorded on various tape recorders with events...

THE 2006 ADJUSTMENT OF THE FUNDAMENTAL CONSTANTS: LOOKING TOWARDS 2010

June 1, 2008

Author(s)

David B. Newell, Peter Mohr, B N. Taylor

A new set of values of the basic fundamental constants has been recommended by the Committee on Data for Science and Technology (CODATA) (http://physics.nist...

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

June 1, 2008

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

See attached.

AUTOMATION OF 1 TOhm TO 100 TOhm ULTRA-HIGH RESISTANCE MEASUREMENTS AT NIST

June 1, 2008

Author(s)

Dean G. Jarrett, Angelica M. Muniz-Mercado, Marlin E. Kraft

The automation of ultra-high resistance measurements at the National Institute of Standards and Technology (NIST) in the range 1 TOhm to 100 TOhm has been...

CHARACTERIZATION OF LOADING EFFECTS IN PRECISION 1 Ohm RESISTORS

June 1, 2008

Author(s)

George R. Jones Jr., Randolph Elmquist

Precision standard resistors manufactured within the last two decades using improved construction techniques and materials, such as the resistance alloy Evanohm...

A TWO-WAY JOSEPHSON VOLTAGE STANDARD COMPARISON BETWEEN NIST AND NRC

June 1, 2008

Author(s)

Yi-hua D. Tang, Barry Wood, Clark Hamilton

A two-way Josephson voltage standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the National Research Council...

UNCERTAINTY EVALUATION IN A TWO-TERMINAL CRYOGENIC CURRENT COMPARATOR

June 1, 2008

Author(s)

Marcos E. Bierzychudek, Randolph Elmquist

In this paper we present the uncertainty evaluation of a new cryogenic current comparator (CCC) bridge designed to compare two-terminal 1M Ω} and 10M Ω}...

HIGH RESISTANCE SCALING FROM 10 k(OHM) AND QHR STANDARDS USING A CRYOGENIC CURRENT COMPARATOR

June 1, 2008

Author(s)

Randolph Elmquist, George R. Jones Jr., Brian J. Pritchard, Marcos E. Bierzychudek, Felipe L. Hernandez

We describe a cryogenic current comparator (CCC) bridge for resistance scaling that provides improved measurement uncertainty over a range of resistance values...

SIM COMPARISON OF DC RESISTANCE AT 1 Ohm, 1 MOhm, AND 1 GOhm

June 1, 2008

Author(s)

Dean G. Jarrett, Randolph Elmquist, Nien F. Zhang, Alejandra Tonina, Janice Fernandes, Daniel Izquierdo, Dave Inglis, Felipe Hernandez-Marquez

A regional comparison of DC resistance standards at the nominal values of 1 Ohm, 1 MOhm, and 1 GOhm has recently been completed in the System Interamericano de...

A Reaction-Diffusion Model for Simulating 3-D Microstructure Development of Cement Paste

May 30, 2008

Author(s)

Jeffrey W. Bullard

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

May 29, 2008

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

See attached

Performance Evaluation of Speech Translation Systems

May 28, 2008

Author(s)

Brian A. Weiss, Craig I. Schlenoff, Gregory A. Sanders, Michelle P. Steves, Sherri Condon, Jon Phillips, Dan Parvaz

One of the most challenging tasks for uniformed service personnel serving in foreign countries is effective verbal communication with the local population. To...

On Enabling a Model-based Systems Engineering Discipline

May 28, 2008

Author(s)

Peter O. Denno, Thomas Thurman, John Mettenburg, Dwayne Hardy

This paper considers the requirements of a model-based systems engineering (MBSE) discipline, and the benefits that would be realized from it. A premise of MBSE...

Translation Adequacy and Preference Evaluation Tool (TAP-ET)

May 28, 2008

Author(s)

Mark A. Przybocki, Kay Peterson, P. S. Bronsart

Evaluation of Machine Translation (MT) technology is often tied to the requirement for tedious manual judgments of translation quality. While automated MT...

Towards a Multi-View Semantic Model for Product Feature Description

May 28, 2008

Author(s)

Patrick Hoffmann, Shaw C. Feng, Gaurav Ameta, Parisa Ghodous, Lihong Qiao

Multiple perspectives need to be included in a product development process. Engineers from different departments usually have different views on a product...

The Challenge of Measuring Defects in Nanoscale Dielectrics

May 26, 2008

Author(s)

Kin P. Cheung, John S. Suehle

Defects in nanoscale gate dielectric of MOS devices can exchange charges with the substrate via quantum mechanical tunneling. This characteristic has been...

Development Life Cycle and Tools for Data Exchange Specification

May 19, 2008

Author(s)

Katherine C. Morris, Puja Goyal, Simon P. Frechette

In enterprise integration, a data exchange specification is an architectural artifact that evolves along with the business. Developing and maintaining a...

Homeland Security Simulation Domain: A Needs Analysis Overview

May 19, 2008

Author(s)

Charles R. McLean, Sanjay Jain, Yung-Tsun T. Lee

The effective use of modeling, simulation, and analysis (MSA) applications could greatly enhance our nation s ability to achieve homeland security goals. The...

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