Broadband Permittivity Measurements of Thin-Film Ferroelectrics to 40 GHz
Nathan D. Orloff, James C. Booth, Makoto Murakami, Ichiro Takeuchi
We demonstrate a novel experimental technique to measure the complex permittivity function of dielectric thin films over the frequency range from 100 Hz to 40 GHz. We apply this technique to determine the broadband permittivity function for ferroelectric thin films such as PbTiO3 at room temperature. We discuss the value of such frequency-dependent measurements for determining the the dielectric response of ferroelectric thin films at finite frequencies.
Broadband Measurements of the Permittivity of Thin-Film Ferroelectrics to 40 GHz
February 25-27, 2008
Santa Fe, NM
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium
, Booth, J.
, Murakami, M.
and Takeuchi, I.
Broadband Permittivity Measurements of Thin-Film Ferroelectrics to 40 GHz, Broadband Measurements of the Permittivity of Thin-Film Ferroelectrics to 40 GHz, Santa Fe, NM, [online], https://doi.org/10.1109/ISAF.2008.4693752
(Accessed December 8, 2023)