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Electronics

Semiconductors

News and Updates

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NIST Seeks Information on the Semiconductor Industry Workforce

July 16, 2018

GAITHERSBURG, Md.—The U.S. Department of Commerce’s National Institute of Standards and Technology (NIST) is seeking information on the “scope and sufficiency...

NIST Researchers Simulate Simple Logic for Nanofluidic Computing

June 29, 2018

Invigorating the idea of computers based on fluids instead of silicon, researchers at the National Institute of Standards and Technology (NIST) have shown how...

NIST Partners with University Effort for Cutting-Edge Semiconductor Technology

February 16, 2018

GAITHERSBURG, Md.—The U.S. Commerce Department’s National Institute of Standards and Technology (NIST) has awarded its first funds for a research consortium...

Illustration of flat memristor device resting on titanium dioxide surface, with yellow electron beam impinging on memristor and ejecting electrons (balls of different colors).

Thanks for the Memory: NIST Takes a Deep Look at Memristors

January 18, 2018

In the race to build a computer that mimics the massive computational power of the human brain, researchers are increasingly turning to memristors, which can...

New Insights on ‘Captured’ Electrons Could Improve Flash Memory

November 7, 2017

An entirely new model of the way electrons are briefly trapped and released in tiny electronic devices suggests that a long-accepted, industry-wide view is just...

Small Wonder

September 25, 2017

NIST helps semiconductor manufacturers—who are under continual pressure to make smaller, faster computer chips—reduce the time required to develop new...

Testing the Performance of Semiconductors – with Light

March 28, 2017

Semiconductors are the cornerstone of modern electronics. They’re used in solar cells, light emitting diodes (LEDs), microprocessors in laptops and cell phones...

Improving CD-AFM Measurements from the Tip Down

March 31, 2016

As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer...

Not So Fast: Overlooked Resistance May Inflate Estimates of Organic-Semiconductor Performance

March 10, 2016

It's hardly a character flaw, but organic transistors—the kind envisioned for a host of flexible electronics devices—behave less than ideally, or at least not...

Electron micrograph of surface-directed nanochannels formed on surface of indium phosphide.

Nanoworld "Snow Blowers" Carve Straight Channels in Semiconductor Surfaces

December 28, 2015

In the nanoworld, tiny particles of gold can operate like snow blowers, churning through surface layers of an important class of semiconductors to dig...

Measuring Nanoscale Features with Fractions of Light

December 2, 2015

National Institute of Standards and Technology (NIST) researchers are seeing the light, but in an altogether different way. And how they are doing it just might...

NIST and Intel Get Critical (Dimensions) with X-rays

October 20, 2015

Researchers from the National Institute of Standards and Technology (NIST) and Intel reported success using an X-ray scattering technique to accurately measure...

Influential Interfaces Lead to Advances in Organic Spintronics

June 30, 2015

Spintronics is an emerging field of electronics in which devices work by manipulating the quantum mechanical spin 1 of electrons, in addition to their...

Detecting Effects of 3D Shapes in Nanoscale Chip Features

April 27, 2015

As microchip feature dimensions approach atomic scale, it becomes formidably difficult to measure their size and shape. According to the International...

Nanoelectronics Conference Focuses on Future of Semiconductor Manufacturing

April 22, 2015

The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts from industry...

Transmission electron microscopy image of a thin cross section of 160 nanometer trenches shows deposited nickel completely filling the features without voids.

NIST-Intel Partnership Workshop

December 3, 2014

In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and Architecture...

Computer simulations of two possible morphologies of a block copolymer film

NIST Offers Electronics Industry Two Ways to Snoop on Self-Organizing Molecules

October 22, 2014

A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes seemed...

Scientists Shed Light on Organic Photovoltaic Characteristics

September 2, 2014

Photovoltaic devices, also known as solar cells, produce electrical power when exposed to light, and that technology has enabled a fast-growing industry. The...

NIST Technique Could Make Sub-wavelength Images at Radio Frequencies

June 17, 2014

Imaging and mapping of electric fields at radio frequencies (RF)* currently requires the use of metallic structures such as dipoles, probes and reference...

PML Leadership Prominent Throughout Newly Released ITRS

April 24, 2014

When the semiconductor industry received the eagerly awaited annual update of the International Technology Roadmap for Semiconductors (ITRS) [1] at the end of...

JILA Physicists Discover 'Quantum Droplet' in Semiconductor

February 26, 2014

JILA physicists used an ultrafast laser and help from German theorists to discover a new semiconductor quasiparticle—a handful of smaller particles that briefly...

MML Researcher R. Joseph Kline Receives Presidential Early Career Award for Scientists and Engineers

January 15, 2014

Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for Scientists...

NIST Chip Measurement Advance Earns 'Oscar of Innovation'

July 12, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for...

Microscopy Technique Could Help Computer Industry Develop 3-D Components

June 25, 2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to...

Multiple views of NIST's photoelectrochemical hydrogen cell.

NIST Demonstrates Significant Improvement in the Performance of Solar-Powered Hydrogen Generation

May 14, 2013

Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a...

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