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Electronics

Semiconductors

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Improving CD-AFM Measurements from the Tip Down

March 31, 2016

As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer...

Not So Fast: Overlooked Resistance May Inflate Estimates of Organic-Semiconductor Performance

March 10, 2016

It's hardly a character flaw, but organic transistors—the kind envisioned for a host of flexible electronics devices—behave less than ideally, or at least not...

Electron micrograph of surface-directed nanochannels formed on surface of indium phosphide.

Nanoworld "Snow Blowers" Carve Straight Channels in Semiconductor Surfaces

December 28, 2015

In the nanoworld, tiny particles of gold can operate like snow blowers, churning through surface layers of an important class of semiconductors to dig...

Measuring Nanoscale Features with Fractions of Light

December 2, 2015

National Institute of Standards and Technology (NIST) researchers are seeing the light, but in an altogether different way. And how they are doing it just might...

NIST and Intel Get Critical (Dimensions) with X-rays

October 20, 2015

Researchers from the National Institute of Standards and Technology (NIST) and Intel reported success using an X-ray scattering technique to accurately measure...

Influential Interfaces Lead to Advances in Organic Spintronics

June 30, 2015

Spintronics is an emerging field of electronics in which devices work by manipulating the quantum mechanical spin 1 of electrons, in addition to their...

Detecting Effects of 3D Shapes in Nanoscale Chip Features

April 27, 2015

As microchip feature dimensions approach atomic scale, it becomes formidably difficult to measure their size and shape. According to the International...

Nanoelectronics Conference Focuses on Future of Semiconductor Manufacturing

April 22, 2015

The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts from industry...

Transmission electron microscopy image of a thin cross section of 160 nanometer trenches shows deposited nickel completely filling the features without voids.

NIST-Intel Partnership Workshop

December 3, 2014

In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and Architecture...

Computer simulations of two possible morphologies of a block copolymer film

NIST Offers Electronics Industry Two Ways to Snoop on Self-Organizing Molecules

October 22, 2014

A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes seemed...

Scientists Shed Light on Organic Photovoltaic Characteristics

September 2, 2014

Photovoltaic devices, also known as solar cells, produce electrical power when exposed to light, and that technology has enabled a fast-growing industry. The...

NIST Technique Could Make Sub-wavelength Images at Radio Frequencies

June 17, 2014

Imaging and mapping of electric fields at radio frequencies (RF)* currently requires the use of metallic structures such as dipoles, probes and reference...

PML Leadership Prominent Throughout Newly Released ITRS

April 24, 2014

When the semiconductor industry received the eagerly awaited annual update of the International Technology Roadmap for Semiconductors (ITRS) [1] at the end of...

JILA Physicists Discover 'Quantum Droplet' in Semiconductor

February 26, 2014

JILA physicists used an ultrafast laser and help from German theorists to discover a new semiconductor quasiparticle—a handful of smaller particles that briefly...

MML Researcher R. Joseph Kline Receives Presidential Early Career Award for Scientists and Engineers

January 15, 2014

Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for Scientists...

NIST Chip Measurement Advance Earns 'Oscar of Innovation'

July 12, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for...

Microscopy Technique Could Help Computer Industry Develop 3-D Components

June 25, 2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to...

Multiple views of NIST's photoelectrochemical hydrogen cell.

NIST Demonstrates Significant Improvement in the Performance of Solar-Powered Hydrogen Generation

May 14, 2013

Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a...

New 3D Defect Detection Fills Important Industry Gap

May 13, 2013

As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to...

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

March 5, 2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference...

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by electron beam-induced decomposition of a diiron nonacarbonyl precursor.

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

October 31, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron...

NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics

October 16, 2012

The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a collaboration of...

September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry

September 5, 2012

The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on "Flexible Printed Electronics...

NIST 'Hybrid Metrology' Method Could Improve Computer Chips

September 5, 2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers...

PML Uses Combined Optical Techniques to Provide Important Answers on Graphene Structures

August 13, 2012

That graphene is the hot new material in the world of future electronics manufacturing is well known. With its high carrier mobility and low noise, graphene is...

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