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Electronics

Semiconductors

News and Updates

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New 3D Defect Detection Fills Important Industry Gap

May 13, 2013

As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to...

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

March 5, 2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference...

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by electron beam-induced decomposition of a diiron nonacarbonyl precursor.

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

October 31, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron...

NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics

October 16, 2012

The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a collaboration of...

September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry

September 5, 2012

The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on "Flexible Printed Electronics...

NIST 'Hybrid Metrology' Method Could Improve Computer Chips

September 5, 2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers...

PML Uses Combined Optical Techniques to Provide Important Answers on Graphene Structures

August 13, 2012

That graphene is the hot new material in the world of future electronics manufacturing is well known. With its high carrier mobility and low noise, graphene is...

A microfluidic lab on a chip device sitting on a polystyrene dish.

NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization

August 8, 2012

Lab on a chip (LOC) devices—microchip-size systems that can prepare and analyze tiny fluid samples with volumes ranging from a few microliters (millionth of a...

Three NIST Researchers Earn Presidential Honor

July 25, 2012

The White House has announced that three researchers at the National Institute of Standards and Technology (NIST) will receive the 2011 Presidential Early...

Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator

July 11, 2012

Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally demonstrated surface...

Shaffique Adam Receives Singapore National Research Foundation Fellowship

June 27, 2012

Shaffique Adam, an NRC Postdoctoral Research Associate in the NIST Center for Nanoscale Science and Technology, has been awarded a 2012 Singapore National...

NIST Announces $2.6 Million in Funding for Novel Semiconductor Research

March 20, 2012

The National Institute of Standards and Technology (NIST) is soliciting proposals to support long-term research in next-generation semiconductor technology...

NIST Reveals Switching Mechanism in Promising Computer Memory Device

February 21, 2012

Sometimes knowing that a new technology works is not enough. You also must know why it works to get marketplace acceptance. New information from the National...

Laying the Groundwork for 3D Stacked Integrated Circuits

February 17, 2012

Could three-dimensional stacked integrated circuits (3DS-ICs) be the next big innovation in technology development? Imagine layer upon layer of integrated...

CNST and Sandia Researchers Publish a Detailed Review of Electrical Contacts in One and Two Dimensional Nanomaterials

February 15, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Sandia National Laboratories have published a detailed review of recent experimental...

PML's Pernstich Develops Open-Source Software to Automate Test Equipment

February 6, 2012

A free, easily customizable software program for automating test equipment via GPIB or RS232 bus may sound too good to be true, especially for smaller companies...

NIST Sensor Improvement Brings Analysis Method into Mainstream

December 20, 2011

An advance in sensor design by researchers at the National Institute of Standards and Technology (NIST) and the University of Waterloo's Institute of Quantum...

PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing

December 9, 2011

A PML research team has devised a reliability data transformation methodology that could ease one of the semiconductor industry's most vexing problems...

NIST Measures Key Property of Potential 'Spintronic' Material

October 19, 2011

An advanced material that could help bring about next-generation "spintronic" computers has revealed one of its fundamental secrets to a team of scientists from...

PML Develops Graphene Fabrication Capability

October 3, 2011

Graphene – a single-layer planar sheet of carbon atoms bound in a "chicken-wire" lattice—has become the object of intense international research ever since its...

Still from video clip. The shows the development of the soliton over the course of about 2.7 nanoseconds.

New Wave: Spin Soliton Could Be a Hit in Cell Phone Communication

September 14, 2010

Researchers at the National Institute of Standards and Technology (NIST) have found theoretical evidence of a new way to generate the high-frequency waves used...

NIST Nanofluidic 'Multi-tool' Separates and Sizes Nanoparticles

August 3, 2010

A wrench or a screwdriver of a single size is useful for some jobs, but for a more complicated project, you need a set of tools of different sizes. Following...

Schematic depicting the creation of liposome-hydrogel hybrids.

Liposome-Hydrogel Hybrids: No Toil, No Trouble for Stronger Bubbles

June 9, 2010

People have been combining materials to bring forth the best properties of both ever since copper and tin were merged to start the Bronze Age. In the latest...

moiré patterns created by overlaid sheets of graphene to determine how the lattices of the individual sheets were stacked in relation to one another and to find subtle strains in the regions of bulges or wrinkles in the sheets.

Seeing Moiré in Graphene

April 27, 2010

Researchers at the National Institute of Standards and Technology (NIST) and the Georgia Institute of Technology have demonstrated that atomic scale moiré...

Photomicrograph shows Mag-µBot, the entry from Carnegie-Mellon University in the NIST Mobile Microrobotics Challenge.

Teams Gearing Up for Two NIST Robotic Competitions in Alaska

April 27, 2010

The recruitment period is over. The competitors have been selected. Let the games begin! The National Institute of Standards and Technology (NIST) has announced...

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