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Electronics

Semiconductors

News and Updates

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EEEL Sponsors INTEL VP's Visit to NIST

March 23, 2010

Dr. Michael C. Mayberry, Vice President of the Technology and Manufacturing Group and Director of Components Research at INTEL Corporation, visited NIST in

Deadline Extended for Entering NIST Microrobotics Challenge

December 15, 2009

An article in the Oct. 20, 2009, issue of NIST Tech Beat, "Is Your Microrobot Up for the (NIST) Challenge?", invited university and collegiate student teams

Is Your Microrobot Up for the (NIST) Challenge?

October 27, 2009

The scientists and engineers who introduced the world to tiny robots demonstrating soccer skills are creating the next level of friendly competition designed to

NIST Calculations May Improve Temperature Measures for Microfluidics

September 8, 2009

If you wanted to know if your child had a fever or be certain that the roast in the oven was thoroughly cooked, you would, of course, use a thermometer that you

Hankering for Molecular Electronics? Grab the New NIST Sandwich

August 25, 2009

The sandwich recipe recently concocted by scientists working at the National Institute of Standards and Technology (NIST) may prove tasty for computer chip

Novel Temperature Calibration Improves NIST Microhotplate Technology

August 11, 2009

Researchers at the National Institute of Standards and Technology (NIST) have developed a new calibration technique that will improve the reliability and

Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games

June 16, 2009

The National Institute of Standards and Technology (NIST) will be serving up "soccer under glass" - the glass of a microscope lens - when nanosoccer makes its

Memory with a Twist: NIST Develops a Flexible Memristor

June 2, 2009

Electronic memory chips may soon gain the ability to bend and twist as a result of work by engineers at the National Institute of Standards and Technology (NIST

NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory

May 20, 2009

Chip manufacturers beware: There's a newfound flaw in our understanding of transistor noise, a phenomenon affecting the electronic on-off switch that makes

Conference Offers Insight Into Exploration of Nano-sized Electronics

April 21, 2009

New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics industry will be

Conference to Focus on Anti-Counterfeiting, Consumer Protection

February 10, 2009

Representatives from business and government agencies concerned with intellectual property rights, particularly those concerning electronic devices, will gather

Typical low-k film test for material toughness using the new NIST technique.

Cracking a Tough Nut for the Semiconductor Industry

December 23, 2008

Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to fracture—of the thin

NIST 'Stress Tests' Probe Nanoscale Strains in Materials

November 25, 2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of stress or strain in

Neutron Researchers Discover Widely Sought Property in Magnetic Semiconductor

November 25, 2008

Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key magnetic—as opposed

Cold Atoms Could Replace Hot Gallium in Focused Ion Beams

November 12, 2008

Scientists at the National Institute of Standards and Technology (NIST) have developed a radical new method of focusing a stream of ions into a point as small

Illustration of restacking organic semiconductors

Bottoms Up: Better Organic Semiconductors for Printable Electronics

September 3, 2008

Researchers from the National Institute of Standards and Technology (NIST) and Seoul National University (SNU) have learned how to tweak a new class of polymer

Exposing the Sensitivity of Extreme Ultraviolet Photoresists

June 24, 2008

Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation semiconductor

'Electron Trapping' May Impact Future Microelectronics Measurements

June 24, 2008

Using an ultra-fast method of measuring how a transistor switches from the "off" to the "on" state, researchers at the National Institute of Standards and

Artist rendition of a tiny robot approaching a malfunctioning red blood cell

Learn About 'NIST and Nanosoccer' from New Web Site and Video

May 28, 2008

If you love soccer but don't want to wait until the next World Cup in 2010 to satisfy your appetite for the most popular game on Earth, the National Institute

Electron micrograph shows a cross-section of a typical SOG microcircuit feature.

Making a Good Impression: Nanoimprint Lithography Tests at NIST

April 29, 2008

In what should be good news for integrated circuit manufacturers, recent studies by the National Institute of Standards and Technology (NIST) have helped

NIST Team Proves Bridge from Conventional to Molecular Electronics Possible

March 18, 2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the "evolutionary link" between the microelectronics of

Good Vibrations Probe Innards of Molecular Electronic Junctions

March 5, 2008

Using an unusual spectroscopic technique, researchers at the National Institute of Standards and Technology (NIST) have provided the most convincing evidence

Man wearing a white protective coverall, hood, gloves and face mask, holds a round, purple, sample of a silicon wafer and presses buttons on a white instrument panel.

Measurement Innovations Add Up to Big Savings for Semiconductors

January 8, 2008

A new report from the National Institute of Standards and Technology (NIST) shows that investment in measurement science has and will continue to have a

Photograph of the NIST micro microwave oven

Micro Microwave Does Pinpoint Cooking for Miniaturized Labs

November 8, 2007

Researchers at the National Institute of Standards and Technology (NIST) and George Mason University have demonstrated what is probably the world's smallest

NIST Presents Its Microfluidics Technologies For Commercial Adoption

October 12, 2007

A TECHNOLOGY TRANSFER AND FEDERAL MARKETPLACE EVENT NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, 2007, NIST

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