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Electronics

Semiconductors

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Hankering for Molecular Electronics? Grab the New NIST Sandwich

August 25, 2009

The sandwich recipe recently concocted by scientists working at the National Institute of Standards and Technology (NIST) may prove tasty for computer chip...

Novel Temperature Calibration Improves NIST Microhotplate Technology

August 11, 2009

Researchers at the National Institute of Standards and Technology (NIST) have developed a new calibration technique that will improve the reliability and...

Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games

June 16, 2009

The National Institute of Standards and Technology (NIST) will be serving up "soccer under glass" - the glass of a microscope lens - when nanosoccer makes its...

Memory with a Twist: NIST Develops a Flexible Memristor

June 2, 2009

Electronic memory chips may soon gain the ability to bend and twist as a result of work by engineers at the National Institute of Standards and Technology (NIST...

NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory

May 20, 2009

Chip manufacturers beware: There's a newfound flaw in our understanding of transistor noise, a phenomenon affecting the electronic on-off switch that makes...

Conference Offers Insight Into Exploration of Nano-sized Electronics

April 21, 2009

New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics industry will be...

Conference to Focus on Anti-Counterfeiting, Consumer Protection

February 10, 2009

Representatives from business and government agencies concerned with intellectual property rights, particularly those concerning electronic devices, will gather...

Typical low-k film test for material toughness using the new NIST technique.

Cracking a Tough Nut for the Semiconductor Industry

December 23, 2008

Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to fracture—of the thin...

NIST 'Stress Tests' Probe Nanoscale Strains in Materials

November 25, 2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of stress or strain in...

Neutron Researchers Discover Widely Sought Property in Magnetic Semiconductor

November 25, 2008

Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key magnetic—as opposed...

Cold Atoms Could Replace Hot Gallium in Focused Ion Beams

November 12, 2008

Scientists at the National Institute of Standards and Technology (NIST) have developed a radical new method of focusing a stream of ions into a point as small...

Illustration of restacking organic semiconductors

Bottoms Up: Better Organic Semiconductors for Printable Electronics

September 3, 2008

Researchers from the National Institute of Standards and Technology (NIST) and Seoul National University (SNU) have learned how to tweak a new class of polymer...

Exposing the Sensitivity of Extreme Ultraviolet Photoresists

June 24, 2008

Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation semiconductor...

'Electron Trapping' May Impact Future Microelectronics Measurements

June 24, 2008

Using an ultra-fast method of measuring how a transistor switches from the "off" to the "on" state, researchers at the National Institute of Standards and...

Artist rendition of a tiny robot approaching a malfunctioning red blood cell

Learn About 'NIST and Nanosoccer' from New Web Site and Video

May 28, 2008

If you love soccer but don't want to wait until the next World Cup in 2010 to satisfy your appetite for the most popular game on Earth, the National Institute...

Electron micrograph shows a cross-section of a typical SOG microcircuit feature.

Making a Good Impression: Nanoimprint Lithography Tests at NIST

April 29, 2008

In what should be good news for integrated circuit manufacturers, recent studies by the National Institute of Standards and Technology (NIST) have helped...

NIST Team Proves Bridge from Conventional to Molecular Electronics Possible

March 18, 2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the "evolutionary link" between the microelectronics of...

Good Vibrations Probe Innards of Molecular Electronic Junctions

March 5, 2008

Using an unusual spectroscopic technique, researchers at the National Institute of Standards and Technology (NIST) have provided the most convincing evidence...

Man wearing a white protective coverall, hood, gloves and face mask, holds a round, purple, sample of a silicon wafer and presses buttons on a white instrument panel.

Measurement Innovations Add Up to Big Savings for Semiconductors

January 8, 2008

A new report from the National Institute of Standards and Technology (NIST) shows that investment in measurement science has and will continue to have a...

Photograph of the NIST micro microwave oven

Micro Microwave Does Pinpoint Cooking for Miniaturized Labs

November 8, 2007

Researchers at the National Institute of Standards and Technology (NIST) and George Mason University have demonstrated what is probably the world's smallest...

NIST Presents Its Microfluidics Technologies For Commercial Adoption

October 12, 2007

A Technology Transfer and Federal Marketplace Event NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, 2007, NIST...

illustration of NIST's modified field-effect transistor

New Quantum Dot Transistor Counts Individual Photons

October 11, 2007

A transistor containing quantum dots that can count individual photons (the smallest particles of light) has been designed and demonstrated at the National...

NIST Releases New Standard for Semiconductor Industry

October 12, 2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of semiconductor...

Noise Measurement May Boost Cell Phone Performance

June 22, 2006

Researchers at the National Institute of Standards and Technology (NIST) and industry collaborators have developed improved methods for accurately measuring...

Simulation Program Predicts Resistivity in Nanodevices

January 17, 2006

As nanoscale circuits continue to shrink, electrical resistivity increases in the wiring and limits the maximum circuit speed. A new simulation program...

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