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Day 1:  December 12, 2019

8:00 - 8:30 AM

Continental Breakfast

8:30 - 8:45 AM

Opening Remarks--- Howard Harary, Director, NIST Engineering Laboratory Ken Boyce, Director, UL Energy & Power Technologies

Session 1: General (Chair: Kenneth Boyce, UL)

8:45 - 9:10 AM

Solar Energy Technologies Office’s PV reliability Efforts and Interests (Lenny Tinker, DOE)

9:10 - 9:35 AM

DuraMat Goals/Accomplishment (Teresa Barnes, NREL)

9:35 - 10:00 AM

Status of Crystalline Si PERC Solar Cells (Qi Wang, JinkoSolar, China)

10:00 - 10:25 AM

Fight Global Warming (Climate Change) with Solar Energy + Multi-Storage Resilient Island Nano-grid Smart Home/Building (John Borland, J.O.B. Technologies)

10:25 - 10:40 AM


Session 2: PV Module Field Survey (Chair: Nancy Phillips, DuPont)

10:40 - 11:05 AM

Durability of Packaging Material in Globally Fielded PV Modules (Jared Tracy, DuPont)

11:05 - 11:30 AM

Real-world and Accelerated Degradation of PV Module Backsheets (Laura Bruckman, Case Western Reserve University)

11:30 – 11:55 AM

Energy yield reductions of PV power plants with c-Si or CIS thin-film PV modules installed in Japan (Tsuyoshi Shioda, Mitsui Chemicals, Japan)

11:55 - 12:15 PM

Panel Discussion 1

(Chairs: John Wohlgemuth PowerMark Corporation; Stephanie Watson, NIST)

12:15 - 1:45PM

Lunch and Poster Session

Session 3: Accelerated Laboratory Testing and Linking to Field Performance (Chair: Teresa Barnes, NREL)

1:45 - 2:10 PM

Climate Specific Accelerated Ageing Tests (Karl Berger, AIT, Austria)

2:10 - 2:35 PM

Co-extruded backsheets for PV modules: Past approaches and recent developments (Gernot Oreski, PCCL, Austria)

2:35 - 3:00 PM

Degradation of PERC and Al-BSF Photovoltaic Cells with Differentiated Minimodule Packaging Materials (Roger French, Case Western Reserve University)

3:00 - 3:15 PM


3:15 - 3:40 PM

Correlating Accelerated Testing to Field Defects in Backsheets: Inner and Outer Layer Cracking and Delamination (Kaushik Roy Choudhury, DuPont)

3:40 - 4:05 PM

Advancing Reliability Assessments of Photovoltaic Modules and Materials through Combined-Accelerated Stress Testing (Michael Owen-Bellini, NREL)

4:05 - 4:30 PM

Solder Bump Coupon Testing of Backsheets for Simplified Comprehensive Evaluation (Mike Kempe, NREL)

4:30 - 4:50 PM

Panel Discussion 2 (Chairs: David Miller, NREL; Ralph Gottschalg, Fraunhofer CSP)

5:00 PM

Adjourn/NIST Labs Tour (NIST SPHERE; Net-Zero Energy House)



Day 2: December 13, 2019

7:45 - 8:15 AM

Continental Breakfast

Session 4: Characterization and Modeling (Chair: Tadanori Tanahashi, AIST; Xiaohong Gu, NIST)

8:15 - 8:40 AM

Fragmentation Test for Assessing Backsheet Cracking Propensity (Xiaohong Gu, NIST)

8:40 - 9:05 AM

Multi-scale, Multi-physics Modeling Capabilities towards Improving PV Reliability (Ashley Maes, Sandia National Laboratories)

9:05 - 9:30 AM

Demonstrating New Concepts for Reliable Low-Cost Module Encapsulation and Moisture Barrier Technologies (Reinhold Dauskardt, Stanford University)

9:30 - 9:55 AM

Measurement, Modeling and Database of Solar Irradiance (Aron Habte / Manajit Sengupta, NREL)

9:55 - 10:10 AM


10:10 - 10:35 AM

Corrosion-induced AC Impedance Elevation in Crystalline Silicon Photovoltaic Cells/Modules (Tadanori Tanahashi, AIST, Japan)

10:35 - 11:00 AM

Degradation and Stability of Polymers: The Role of Aggregation Structure and A New Stabilization Method (Guangxian Li, Sichuan University, China)

11:00 - 11:25 AM

Statistical Modeling for Service Life Prediction of PV Materials (Yili Hong, Virginia Tech)

11:25 - 11:50 AM

Physics-Based Machine Learning to Enable Reliable Modules & Sustainable Solar Farms

(Muhammad Alam, Purdue University)

11:50 - 12:15 PM

Panel Discussion 3 (Chairs: Qi Wang, JinkoSolar; Gernot Oreski, PCCL)

12:15 - 1:30 PM


Session 5: Link Research to Standards (Chairs: Steve Hogan, Hogan Renewable; Coleen O’Brien, UL)

1:30 - 1:55 PM

Risks Embedded in the Current Quality Assurance Scheme in the PV Industry (Ralph Gottschalg, Fraunhofer CSP, Germany)

1:55 - 2:20 PM

Revision of the PV Module Qualification Standard (IEC 61215) (John Wohlgemuth, PowerMark Corporation)

2:20 - 2:55 PM

Approaches to Component Reliability in IEC Standards Development (Nancy Phillips, DuPont)

2:55 - 3:10 PM


3:10 - 3:35 PM

Round-robin Verification of Specimen Temperature during Accelerated Testing for the PVQAT TG5 Studies (David Miller, NREL)

3:35 - 4:00 PM

Recent Progress and Results from IECRE Activities (Steve Hogan, Hogan Renewables)

4:00 – 4:25 PM

PV Module Safety and Performance Standard Requirements in Extreme Environmental Conditions (Colleen O’Brien, UL)

4:25 - 4:50 PM

Panel Discussion 4 (Chairs: Mike Kempe, NREL; Karl Berger, AIT)

4:50 - 5:00 PM

Summary and Adjourn (Kenneth Boyce, UL & Xiaohong Gu, NIST)


Created January 15, 2020