Scope: With intensified pricing pressure, low cost and emerging materials/technologies are increasingly used in photovoltaic (PV) module manufacturing. To respond to new challenges of durability and reliability assessment of PV materials and modules, the National Institute of Standards and Technology (NIST) and the Underwriters Laboratories (UL) are pleased to host a two-day workshop on Photovoltaic Materials Durability for the global photovoltaic community. This workshop is distinguished from other PV conferences by its focus on weathering, measurement, and modeling of durability for materials used in solar PV applications.
The NIST/UL Workshop on Photovoltaic Materials Durability will feature invited technical presentations, a poster session, standards discussion, and a NIST facility tour. This event will provide a forum for the exchange of research, innovation and methodology for participants ranging from material suppliers, module manufacturers, testing and certification companies to universities and national laboratories. Attendees will not only hear about advanced lifetime test methods, but will also have an opportunity to engage in open discussions on how to convert advanced research to consensus standards development.
Areas specifically addressed, but not limited to:
Development in PV materials, module technology and applications
Modeling and lifetime assessment
Standards and Safety
PV module recycling
PV system resilience after natural disasters
Who should attend:
National Institute of Standards and Technology (NIST) and Underwriter Laboratory (UL)
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12.
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NIST currently accepts other forms of federally issued identification in lieu of a state-issued driver's license, such as a valid passport, passport card, DOD's Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, Military Dependents ID, Transportation Workers Identification Credential (TWIC), and TSA Trusted Traveler ID.