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The project aims to develop the metrology for accurate, reliable characterization of nanostructures using the deep ultraviolet (DUV) and extreme ultraviolet
The Dynamic EUV Imaging and Spectroscopy for Microelectronics program in the Spin Electronics group makes use of an ultra-fast, coherent, extreme ultraviolet
As a result of their novel properties, nanoparticles are expected to be produced and incorporated into consumer products at exponentially increasing quantities
The information economy – the modern economy that heavily dependent on information gathering, transmitting, processing, storing, utilizing and consuming is
Develop and apply advanced measurement methods, electric field reference materials, and COMSOL models to make electrical scanning probe microscopes (eSPMs)
Electron-beam lithography enables fine control of nanostructure features that form the basis of diverse nanotechnologies. The Nanostructure Fabrication and
The electronic properties of a material govern how they will be used in device form. We apply electron-based analytical methods to image the electronic
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate
This project comprises of two complimentary components: 1.) the controlled synthesis of selectively engineered magnetic nanoparticles (MNPs) in support of the
Nanoparticle-based consumer products are becoming available in the market at an increasing rate, but the safety of nanoparticles and the environmental fate of
Emerging technology extends beyond electrical performance and seeks to take advantage of alternative energy and information carriers in materials, such as
NIST is engaged in a joint effort between the Material Measurement Laboratory (MML) and the Physical Measurement Laboratory (PML) aimed at revolutionizing 3D
Magnetic tunnel junctions, nanostructured by highly charged ions, are being probed and characterized to establish the foundation for novel magnetic random
MATLAB Software [1-2] developed and referenced within Fluctuations and Nanoscale Control projects are available for download from this page. If you use this
Focused-ion-beam machining is a powerful method to directly form complex nanostructures. The Nanostructure Fabrication and Measurement Group develops novel
This project provides methods, standards, and services for characterizing surface texture and microform in manufacturing, forensics, and science. We seek to
GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This
We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and
The magnetic moment of an electron, often referred to as the electron’s spin, is a unique identifier of an electron’s atomic-scale environment. Thus, the
Scanning probe technology is an essential tool for measuring nanostructure properties. A major goal in our project is to develop unique probes that combine
Integrated photonics uses micro-and nano-fabrication techniques to develop compact devices that can replace bulk optics. Low size, weight, and power (SWAP)