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Projects/Programs

Displaying 26 - 50 of 106

Electrical Scanning Probe Microscopy

Ongoing
Develop and apply advanced measurement methods, electric field reference materials, and COMSOL models to make electrical scanning probe microscopes (eSPMs)

Electron-beam lithography

Ongoing
Electron-beam lithography enables fine control of nanostructure features that form the basis of diverse nanotechnologies. The Nanostructure Fabrication and

Electronic Material Characterization

Ongoing
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Extreme Atom Probe Tomography

Ongoing
NIST is engaged in a joint effort between the Material Measurement Laboratory (MML) and the Physical Measurement Laboratory (PML) aimed at revolutionizing 3D

Focused-ion-beam machining

Ongoing
Focused-ion-beam machining is a powerful method to directly form complex nanostructures. The Nanostructure Fabrication and Measurement Group develops novel

GaN Nanowire Growth

Ongoing
GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This

GaN Nanowire Metrology and Applications

Ongoing
We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and

Integrated Photonics

Ongoing
Integrated photonics uses micro-and nano-fabrication techniques to develop compact devices that can replace bulk optics. Low size, weight, and power (SWAP)

Ion Traps

Ongoing
The Ion Traps Project collaborates with PML's Ion Storage Group to lower the intrinsic heating of ions from ion trap components.