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Electronics

Semiconductors

Projects/Programs

Keyword

Organizational Unit

Nanocalorimetry

Ongoing

Nanocalorimetry using micromachined devices has the capability to provide quantitative data to support the development of advanced metal silicide metallizations

Nanocalorimetry Measurements

Ongoing

Nanocalorimetry provides a capability to measure the thermal properties of very small samples and at very fast rates. Materials and interfaces of interest

Nanocalorimetry for Semiconductors and Semiconductor Process Metrology

Ongoing

Advanced methods to measure the thermal properties of thin films and interfaces are required to understand and improve microelectronic device fabrication

Nanoelectromagnetics

Ongoing

The core activities in this program are the development and application of metrology for quantitative characterization of hetero-structured materials and

Nanometrology: Composition and Structure of Nanomaterials

Ongoing

Advances in methods, instrumentation and analysis protocols are developed to enhance measurement science capabilities in nanomaterial elemental and

Nanophononic Metamaterials for Thermoelectrics

Ongoing

Heat is carried in solid materials predominantly by atomic vibrational waves called phonons. Theory, simulations and experiments have shown that heat transport

Nanoscale, Element-Specific X-ray Imaging for Integrated Circuit Metrology

Ongoing

A current lack of 3D characterization tools that meet semiconductor industry needs is hampering manufacturing fidelity and supply chain security. Developing new

Nanoscale Property Measurements by Atomic Force Microscopy

Ongoing

Develop instrumentation, measurement methodologies, and analytical and numerical analysis for mechanical and electrical atomic force microscopy-based

A scanning electron micrograph of a QDOGFET device used for photon number-resolving detection.

Nanostructure Fabrication and Metrology

Completed

Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or photomultiplier tubes are

The Nanotechnology Xccelerator

Ongoing

The Nanotechnology Xccelerator is a pilot program to develop a powerful new family of foundry platforms and test vehicles for academics to do scientific

Neuromorphic Device Measurements

Ongoing

Neuromorphic computing is a radical new approach to information processing for artificial intelligence where, instead of using digital electronics, inspiration

Non-Destructive Semiconductor Structure Function and Process Optimization for future Microelectronics Manufacturing at the NIST NSLS-II Beamline for XAFS and Diffraction

Ongoing

NIST Synchrotron beamline characterization of advanced semiconductor materials structure, chemical, electronic, and strain properties has been an ongoing

Novel Sources for Focused-ion Beams

Completed

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. We are developing novel cold-atom based ion sources

Optical and Microwave Spectroscopy of Microelectronic Systems

Ongoing

The Optical and Microwave Spectroscopy of Microelectronic Systems program in the Spin Electronics group applies best-in-the-world and novel microwave and

Optical Probes of 2D Magnetic Phenomena

Ongoing

We develop novel inelastic scattering methodologies to probe, quantify, and control key magnetic phenomena in 2D materials for applications in beyond CMOS

Overcoming Barriers: Nanoscale Interface Metrology and Electrical Characterization for Advanced Electronics

Ongoing

As devices become smaller, more complex, and more highly integrated, interfaces are increasingly important and limiting. The ability to accurately predict

Plasma Process Metrology

Ongoing

Our multifaceted program provides numerous outputs to assist our customers. First, we develop and evaluate a variety of measurement techniques that provide

Polymers for Next-Generation Lithography

Completed

Our goal is to develop measurement methods with sufficiently high spatial resolution to uncover the materials limitations in the resolution of state-of-the-art

Power Conditioning Systems for Renewables, Storage, and Microgrids

Ongoing

This project develops the measurement science necessary to support the widespread use of advanced power electronics to provide new functionality in the smart

A 3" wafer is seen concentric with the lower plasma electrode.

Precision Materials for Quantum Devices

Ongoing

Tunnel junctions, single electron transistors and superconducting resonators are fabricated using ultra-high vacuum metals’ deposition and in situ low energy

Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry

Ongoing

Atom probe microscopy was developed over 50 years ago; however, only within the last 15 years has the technique begun to see widespread use, due to the

Quantitative Assessment of Defects and Related Modeling Parameters in GaN Semiconductor Devices

Ongoing

The power electronics and radio frequency (RF) communications industries increasingly rely on semiconductors in the GaN/AlGaN family, where performance is

Reliability Metrologies for Advanced Electronic Interconnects

Completed

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such tests are

Semiconductor Nanowire Metrology: Electronics, Photonics, and Sensors

Completed

In this project, we are developing metrology needed for the synthesis, processing, and characterization of semiconductor nanowire structures to enable reliable

Smart Grid System Testbed Facility

Completed

The Smart Grid Testbed Facility is a unique set of interconnected modules on the NIST Gaithersburg site. Designed as a platform to measure and characterize

NIST Headquarters
-Creating Helpful Incentives to Produce Semiconductors for America (CHIPS)
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---Financial Systems and Reporting Division
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---Office of Financial Resource Management
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--Communications Technology Laboratory
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---Spectrum Technology and Research Division
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----Fiber Sources and Applications Group
----Shared Spectrum Metrology Group
----Spectrum Technology and Research – HQ
---Wireless Networks Division
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----Wireless Networks Division - HQ
----Wireless Systems Innovation and Performance Group
---Public Safety Communications Research Division
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----Advanced Communications Research Group
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---Building Energy and Environment Division
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---Materials and Structural Systems Division
----Earthquake Engineering Group
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----Materials and Structural Systems - HQ
----Polymeric Materials Group
----Structures Group
---Engineering Laboratory Office
----Applied Economics Office
----Engineering Laboratory - HQ
----Engineering Laboratory Data, Security, Technology Group
---Fire Research Division
----National Fire Research Laboratory Group
----Wildland Urban Interface Fire Group
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----Fire Research - HQ
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---Applied and Computational Mathematics Division
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----High Performance Computing and Visualization Group
----Applied and Computational Mathematics - HQ
---Statistical Engineering Division
----Applied and Computational Statistics Group
----Statistical Design, Analysis, and Modeling Group
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---Software and Systems Division
----Systems Interoperability Group
----Software Quality Group
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----Cyber Infrastructure Group
----Information Systems Group
---Information Access Division
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----Image Group
----Multimodal Information Group
----Retrieval Group
----Visualization and Usability Group
---Information Technology Laboratory Office
----Office of Computational Science for Metrology
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----Office of IT Standardization
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----Office of Chief Cybersecurity Advisor
--Laboratory Programs
---Research Protections Office
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---Special Programs Office
----Special Programs Office-HQ
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---Associate Director for Laboratory Programs
----Associate Director for Laboratory Programs - HQ
--Material Measurement Laboratory
---Office of Reference Materials
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----Business Application Development, Support, and Security Group
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----Office of Reference Materials - HQ
----Materials and Physical Services Group
---Office of Data and Informatics
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----Data Services Group
----Data Sciences Group
---Biosystems and Biomaterials Division
----Biomarker and Genomic Sciences Group
----Cellular Engineering Group
----Biomaterials Group
----Genome-Scale Measurements Group
----Complex Microbial Systems Group
----Cell Systems Science Group
----Biosystems and Biomaterials Division - HQ
---Chemical Sciences Division
----Biochemical and Exposure Science Group
----Chemical Informatics Group
----Optical Measurements Group
----Chemical Process and Nuclear Measurements Group
----Gas Sensing Metrology Group
----Inorganic Chemical Metrology Group
----Biospecimen Science Group
----Environmental Chemical Sciences Group
----Chemical Sciences Division - HQ
----Marine Biochemical Sciences Group
----Organic Chemical Metrology Group
---Biomolecular Measurement Division
----Biomolecular Structure and Function Group
----Mass Spectrometry Data Center Group
----Bioprocess Measurements Group
----Bioanalytical Science Group
----Biomolecular Measurement Division - HQ
----Applied Genetics Group
---Applied Chemicals and Materials Division
----Applied Chemicals and Materials Division - HQ
----Thermodynamics Research Center Group
----Thermophysical Properties of Fluids Group
----Nanoscale Reliability Group
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----Fatigue and Fracture Group
---Materials Science and Engineering Division
----Thermodynamics and Kinetics Group
----Polymers Processing Group
----Mechanical Performance Group
----Polymers and Complex Fluids Group
----Materials Science and Engineering Division - HQ
----Functional Polymers Group
----Functional Nanostructured Materials Group
---Materials Measurement Science Division
----Security Technologies Group
----Surface and Trace Chemical Analysis Group
----Nanomechanical Properties Group
----Nano Materials Research Group
----Materials Structure and Data Group
----Microscopy and Microanalysis Research Group
----Synchrotron Science Group
----Materials Measurement Science Division - HQ
----Data and AI-Driven Materials Science Group
---Material Measurement Laboratory Office
----The Material Measurement Laboratory Office of Operations Group
----Material Measurement Laboratory - HQ
----Genome-Scale Measurement Group
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--Physical Measurement Laboratory
---Microsystems and Nanotechnology Division
----Biophysical and Biomedical Measurement Group
----Microsystems and Nanotechnology - HQ
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----Photonics and Optomechanics Group
---Time and Frequency Division
----Atomic Devices & Instrumentation Group
----Precision Photonic Synthesis Group
----Quantum & Nonlinear Nanophotonics Group
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----Ion Storage Group
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----Time Realization and Distribution Group
----Phase Noise Metrology Group
----Time and Frequency - HQ
---Quantum Physics Division
----Quantum Physics - HQ
---Radiation Physics Division
----Dosimetry Group
----Radioactivity Group
----Radiation Physics - HQ
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---Sensor Science Division
----Fundamental Thermodynamics Group
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----Dimensional Metrology Group
----Temperature & Humidity Group
----Remote Sensing Group
----Optical Radiation Group
----Fluid Metrology Group
----Surface and Interface Metrology Group
---Applied Physics Division
----Advanced Microwave Photonics Group
----Spin Electronics Group
----Applied Physics - HQ
----Faint Photonics Group
----Quantitative Nanostructure Characterization Group
----Quantum Devices Group
----Molecular and Bio-Photonics Group
----Optoelectronic Manufacturing Group
----Magnetic Imaging Group
----Quantum Nanophotonics Group
----Sources and Detectors Group
---Quantum Measurement Division
----Quantum Optics Group
----Mass and Force Group
----Quantum Measurement - HQ
----Laser Cooling and Trapping Group
----Fundamental Electrical Measurements Group
----Applied Electrical Metrology Group
----Atomic Spectroscopy Group
---Quantum Sensors Division
----Device Fabrication Group
----Long Wavelength Sensors and Applications Group
----Quantum Calorimeters Group
----Quantum Electronics Group
----Quantum Processing Group
----Quantum Sensors Group
----Quantum Sensors – HQ
----Nanoscale Spin Dynamics Group
----Microfabrication Group
----Spin Electronics Group
----Magnetics Group
---Nanoscale Device Characterization Division
----Atom Scale Device Group
----Nanoscale Device Characterization Division - HQ
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----Nanoscale Spectroscopy Group
----Advanced Electronics Group
----Nanoscale Processes and Measurements Group
---Physical Measurement Laboratory Office
----Boulder Microfabrication Facility
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-Innovation & Industry Services
--Office of Advanced Manufacturing
---Microelectronics Manufacturing Division
----Microelectronics Manufacturing – HQ
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---Office of Advanced Manufacturing
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--Baldrige Performance Excellence Program
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--Innovation & Industry Services
---Associate Director for Innovation & Industry Services
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---Advanced Manufacturing Office
----Advanced Manufacturing Office - HQ
---Economic Analysis Office
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---Technology Partnerships Office
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--Hollings Manufacturing Extension Partnership Program
---National Platforms Division
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---Network Learning and Strategic Competitions Division
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---Performance Evaluation and Economic Impacts Division
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----Node A Group
---Internal Operations Division
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---Extension Services Division
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---Hollings Manufacturing Extension Partnership Program Office
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-Director's Office
--Director's Office
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---Management and Organization Office
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---International and Academic Affairs Office
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