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Search Publications by: Dylan Williams (Fed)

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Displaying 376 - 400 of 583

Transmission-line Parameter Approximation for Digital Simulation

November 1, 2001
Author(s)
Dylan Williams, Christopher L. Holloway
This paper compares closed-form approximations for coplanar waveguide and microstrip transmission-line parameters to accurate measurements and full-wave calculations. We suggest improved approximations and demonstrate the limitations of our proposed and

Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

October 1, 2001
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study

Measuring the Frequency Response of Gigabit Chip Photodiodes

September 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams, E. Balta, N. D. Taneja
We describe a calibratin and measurement procedure for determining the intrinsic frequency response fo gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time-domain using a calibrated

Analytic Sampling-Circuit Model

June 1, 2001
Author(s)
Dylan F. Williams, Catherine A. Remley
Abstract: We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction

Calibrating Electro-Optic Sampling Systems

May 1, 2001
Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We apply frequency-domain impedance mismatch corrections to a temporal electro-optic sampling system. We identify and evaluate additional sources of measurement uncertainty. We use the system to characterize the magnitude and phase response of a

Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

May 1, 2001
Author(s)
Kate Remley, Dylan Williams, Donald C. DeGroot, Jan Verspecht, John Kerley
We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the noise-to-nose calibration, that the kickout is identical in shape to the impulse response of the sampler. We offer a physical explanation for the error

Four-Port Microwave Measurement System Speeds On-Wafer Calibration and Test

March 1, 2001
Author(s)
Dave K. Walker, Dylan F. Williams, Allen Padilla, Uwe Arz, Hartmut Grabinski
A multiport measurement system comprising a coaxial switch network and comprehensive freeware package extends the capabilities of a user's two-port automatic network analyzer and probe station to three-and four-port measurements. The coaxial switch matrix

Frequency Response Metrology for High-Speed Optical Receivers

March 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams
There are two types of optical sources whose modulation can be measured or calculated from fundamental principles: the hererodyne beat between two single- frequency lasers (frequency-domain) and the short pulse from a mode-locked laser (time-domain). While

Asymmetric coupled CMOS lines-an experimental study

December 1, 2000
Author(s)
Uwe Arz, Dylan F. Williams, Dave K. Walker, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25- m CMOS technology over the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from calibrated four-port

Lumped-Element Models for On-Wafer Calibration

December 1, 2000
Author(s)
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards
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