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Search Publications by: Dylan Williams (Fed)

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Displaying 351 - 375 of 583

Phase Detrending for Measured Multisine Signals

June 13, 2003
Author(s)
Kate Remley, Dylan Williams, Dominique Schreurs, Giovanni Loglio, Cidronali Alessandro
We develop a method to detrend the phases of measured multisine signals. We find a time reference that removes the linear component of the measured phases and aligns them to their expected values to the precision specified by the user. An initial guess is

VNA Calibration Software Manual

June 1, 2003
Author(s)
Dylan Williams, Jack Wang, Uwe Arz
This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding

Measuring the Invasiveness of High-Impedance Probes

May 14, 2003
Author(s)
Uwe Arz, Pavel Kabos, Dylan Williams
We use on-wafer measurements to characterize the invasiveness of high-impedance probes over a broad frequency range. We show that a two-port representation characterizing the invasiveness of the probe can also be determined from a calculation of the probe

Causal Characteristic Impedance of Planar Transmission Lines

May 1, 2003
Author(s)
Dylan F. Williams, Bradley K. Alpert, Uwe Arz, Hartmut Grabinski
Abstract: We compute power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip and coplanar-waveguide transmission lines on insulating and conducting silicon substrates, and compare to measurement.

Calibrated Measurement of Optoelectronic Frequency Response

April 1, 2003
Author(s)
Paul D. Hale, Dylan Williams
We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.

Calibrated Waveform Measurement with High-Impedance Probes

February 1, 2003
Author(s)
Pavel Kabos, Howard C. Reader, Uwe Arz, Dylan Williams
We develop an on-wafer waveform calibration technique that combines frequency-domain mismatch corrections to account for the effects of the probe on the measurement with an oscilloscope calibration. The mismatch correction is general and can be applied to

Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques

January 1, 2003
Author(s)
M M. Maska, Jon Martens, Tracy S. Clement, Paul D. Hale, Dylan Williams
This paper discusses the typical uncertainties associated with characterizing high speed photodiodes to 65 GHz when using a vector network analyzer measurement technique. We analyzed the accuracy of the technique by comparing measurements of two reference

Permittivity Characterization of Low-k Thin films from Transmission-Line Measurements

January 1, 2003
Author(s)
Michael D. Janezic, Dylan Williams, V. Blaschke, A. Karamcheti, Fengbo Hang
We develop a broadband technique for measuring the permittivity of low-k thin films using microstrip transmission-line measurements. From measurements of the complex microstrip propagation constant and the characteristics impedance, we determine the

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Applications of Calibration Comparison in On-wafer Measurement

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams
In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications

Characteristic Impedance Measurement of Planar Transmission Lines

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and

Wideband Frequency-Domain Characterization of High-Impedance Probes

November 30, 2001
Author(s)
Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F. Williams
In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both
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