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Search Publications by: Dylan Williams (Fed)

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Displaying 401 - 425 of 583

Lumped-Element Models for On-Wafer Calibration

December 1, 2000
Author(s)
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the

Accurate Electrical Measurement of Coupled Lines on Lossy Silicon

October 1, 2000
Author(s)
Uwe Arz, Dylan F. Williams, Dave K. Walker, Hartmut Grabinski
In this paper we apply a measurement method designed for asymmetric coupled lines to determine the broadband propagation characteristics of symmetric coupled lines fabricated on a highly conductive silicon substrate. We show that the matrices of frequency

Contact-Pad Design for High-Frequency Silicon Measurements

October 1, 2000
Author(s)
Dylan Williams, A. C. Byers, V. C. Tyree, Dave K. Walker, J. J. Ou, X. Jin, M. Piket-Moy, C. Hu
We measure and compare the electrical parasitics of contact pads of different designs fabricated on silicon integrated circuits and develop a strategy for reducing the parasitics.

On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates

September 25, 2000
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which is

Computation of Causal Characteristic Impedances

June 12, 2000
Author(s)
Dylan F. Williams, Ronald C. Wittmann
We develop a numerical method of determining the magnitude of characteristic impedance required by causal power-normalized circuit theories from its phase using a Hilbert-transform relationship. We also estimate the uncertainty in the method.

Characterization of Asymmetric Coupled CMOS Lines

June 1, 2000
Author(s)
Uwe Arz, Dylan F. Williams, Dave K. Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter

Coplanar-Waveguide-to-Microstrip Transition Model

June 1, 2000
Author(s)
Wojciech Wiatr, Dave K. Walker, Dylan Williams
We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped model accounts for mutual inductive coupling and works well up to about 30 GHz.

Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation

June 1, 2000
Author(s)
Catherine A. Remley, Dylan F. Williams, Donald C. DeGroot
We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.

Causality and Characteristic Impedance

December 2, 1999
Author(s)
Dylan F. Williams, Bradley K. Alpert
A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.

Nose-to-Nose Response of a 20-GHz Sampling Circuit

December 1, 1999
Author(s)
Dylan F. Williams, Catherine A. Remley, Donald C. DeGroot
We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impedance
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