U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by:

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 25 of 31

Progress toward a 1 V Pulse-Driven AC Josephson Voltage Standard

April 1, 2009
Author(s)
Samuel P. Benz, Paul D. Dresselhaus, Alain Rufenacht, Norman F. Bergren, Joseph R. Kinard Jr., Regis Landim
We present a new record rms output voltage of 275 mV, which is a 25 % improvement over the maximum achieved with previous ac Josephson voltage standard (ACJVS) circuits. We demonstrate operating margins for these circuits and use them to measure the

Design of a Turn-Key 10 V Programmable Josephson Voltage Standard System

June 13, 2008
Author(s)
Paul D. Dresselhaus, Mike Elsbury, Charles J. Burroughs, David I. Olaya, Samuel P. Benz, Norman F. Bergren, Robert E. Schwall, Zoya Popovic
NIST is designing a 10 V Programmable Josephson Voltage Standard (PJVS) system with an improved microwave design and arrays of stacked NbXSi1-x-barrier Josephson junctions. For this new design a ?ground-up? approach, was used which takes into account all

Progress toward a 1V Pulse-Driven AC Josephson Voltage Standard

June 9, 2008
Author(s)
Samuel Benz, Paul Dresselhaus, Norman F. Bergren, Regis Landim
We present a new record output voltage of 275 mVrms, which is a 25% improvement over the maximum achieved with previous ac Josephson voltage standard circuits. We demonstrate operating margins for these circuits and use them to measure the harmonic

Design of SNS Josephson Arrays for High Voltage Applications

June 4, 2007
Author(s)
Paul Dresselhaus, Samuel Benz, Charles J. Burroughs, Norman F. Bergren, Yonuk Chong
The voltage from a single, microwave-biased Josephson junction is a small quantity; thus useful voltages are only generated through series arrays of many thousands of junctions. Arrays of superconductor-normal metal-superconductor junctions have been

Precision Measurements using a 300 mV Josephson Arbitrary Waveform Synthesizer

June 4, 2007
Author(s)
Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs, Norman F. Bergren
We have developed a Josephson Digital-to-Analog Converter, otherwise know as a Josephson Arbitrary Waveform Synthesizer, with 300 mV peak output voltage. This is the first system of its kind with demonstrated quantum accuracy. We will show precision

AC-DC Transfer Standard Measurements with an AC Josephson Voltage Standard

April 2, 2007
Author(s)
Samuel P. Benz, Charles J. Burroughs, Paul D. Dresselhaus, Norman F. Bergren, Thomas E. Lipe, Joseph R. Kinard Jr., Yi-hua Tang
In order to improve the NIST low-voltage calibration service for thermal voltage converters, we have constructed an ac Josephson voltage standard system that can synthesize accurate rms voltages up to 100 mV. Using this system, we synthesized dc voltages

Time-Division SQUID Multiplexers

February 1, 2002
Author(s)
Kent D. Irwin, Leila R. Vale, Norman F. Bergren, Steven Deiker, Erich N. Grossman, Gene C. Hilton, John M. Martinis, Sae Woo Nam, Carl D. Reintsema, David A. Rudman, Martin Huber
SQUID multiplexers (MUX) make is possible to build arrays of thousands of low-temperature bolometers and microcalorimeters based on superconducting transition-edge sensors (TES) with a manageable number of readout channels. We discuss the technical

Progress Towards Arrays of Microcalorimeter X-ray Detectors

September 1, 2001
Author(s)
Sae Woo Nam, David A. Wollman, Dale Newbury, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
The high performance of single-pixel microcalorimeter EDS (υcal EDS) has been shown to be very useful for a variety of microanalysis cases. The primary advantage of υcal EDS over conventional EDS is that factor of 25 improvement in energy resolution (3 eV

Microfabricated Transition-Edge X-ray Detectors

March 1, 2001
Author(s)
Gene C. Hilton, John M. Martinis, Kent D. Irwin, Norman F. Bergren, David A. Wollman, Martin Huber, Sae Woo Nam
We are developing high performance x-ray detectors based on superconducting transition-edge sensors (TES) for application in materials analysis and astronomy. Using our recently developed fully lithographic TES fabrication process, we have made devices

Low Voltage Microanalysis using Microcalorimeter EDS

January 1, 2001
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, John M. Martinis, Martin Huber, Dale Newbury
We present the current performance of the prototype high-resolution microcalorimeter energy-dispersive spectrometer (υcal EDS) developed at NIST for x-ray microanalysis. In particular, the low-energy υcal EDS designed for operation in the energy range from

A Mo-Cu Superconducting Transition-Edge Microcalorimeter with 4.5 eV Energy Resolution at 6 keV

December 31, 2000
Author(s)
Kent D. Irwin, Gene C. Hilton, John M. Martinis, Steven Deiker, Norman F. Bergren, Sae Woo Nam, David A. Rudman, David A. Wollman
We describe a superconducting transition-edge microcalorimeter with an energy resolution of 4.5 1 0.1 eV full-width at half-maximum (FWHM) for Mn Kα X-rays from an 55Fe source. The thermometer consists of a photolithographically patterned Mo-Cu

Superconducting Transition-Edge-Microcalorimeter X-ray Spectrometer with 2 eV Energy Resolution at 1.5 keV

December 31, 2000
Author(s)
David A. Wollman, Sae Woo Nam, Dale Newbury, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, Steven Deiker, David A. Rudman, John M. Martinis
We describe the operation and performance of a prototype microcalorimeter ?energy-dispersive? (nondispersive) x-ray spectrometer (mcal EDS) developed at NIST for use in x-ray microanalysis and x-ray astronomy. The low-energy microcalorimeter detector

Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis

November 1, 2000
Author(s)
David A. Wollman, John M. Martinis, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, Martin Huber, Dale Newbury
Improved x-ray detector technology continues to be a critical metrological need in the semiconductor industry for contaminant particle analysis 1,2 and for high-spatial-resolution x-ray microanalysis using low-beam-voltage field-emission scanning electron

Microcalorimeter EDS: Benefits and Drawbacks

August 1, 2000
Author(s)
David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
The commercial introduction of high-count-rate, near-room-temperature silicon drift detectors (presently available) and high-energy-resolution cryogenic microcalorimeters (forthcoming) is an exciting development in x-ray microanalysis, in which detector

Microcalorimeter Energy-Dispersive Spectrometry Using a Low Voltage Scanning Electron Microscope

July 1, 2000
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis, Dale Newbury
We describe the current performance of the prototype microcalorimeter energy-dispersive spectrometer (5cal EDS) developed at NIST for X-ray microanalysis. We show that the low-energy 5cal EDS, designed for operation in the energy range 0.2-2 keV, offers

The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer

June 1, 2000
Author(s)
Dale E. Newbury, David A. Wollman, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis
We have developed a high-resolution energy-dispersive x-ray spectrometer (EDS) based on cryogenic microcalorimeter x-ray detectors for use in x-ray microanalysis. With an energy resolution of 3 eV at 1.5 keV, count rate of {approximately} 500 s -1, and an

Microcalorimeter EDS Measurements of Chemical Shifts in Fe Compounds

July 1, 1998
Author(s)
David A. Wollman, Dale E. Newbury, Gene C. Hilton, Kent D. Irwin, L L. Dulcie, Norman F. Bergren, John M. Martinis
Chemical shifts result from changes in electron binding energies with the chemical environment of atoms. In x-ray spectra, chemical shifts lead to changes in x-ray peak positions, relative peak intensities, and peak shapes. These chemical bonding effects