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Microcalorimeter EDS for Low Voltage Microanalysis



David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
Proceedings Title
Inst. Phys. Conf. Ser. Symp. 2
Conference Dates
July 9-13, 2000
Conference Location
Kona, HI, USA
Conference Title
2nd Conf. Int. Union Microbeam Analysis Societies


Wollman, D. , Newbury, D. , Nam, S. , Hilton, G. , Irwin, K. , Rudman, D. , Deiker, S. , Bergren, N. and Martinis, J. (2000), Microcalorimeter EDS for Low Voltage Microanalysis, Inst. Phys. Conf. Ser. Symp. 2, Kona, HI, USA (Accessed March 2, 2024)
Created July 31, 2000, Updated October 12, 2021