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PUBLICATIONS

Microcalorimeter EDS for Low Voltage Microanalysis

Published

Author(s)

David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
Proceedings Title
Inst. Phys. Conf. Ser. Symp. 2
Volume
165
Conference Dates
July 9-13, 2000
Conference Location
Kona, HI, USA
Conference Title
2nd Conf. Int. Union Microbeam Analysis Societies
Pub Type
Conferences

Citation

Wollman, D. , Newbury, D. , Nam, S. , Hilton, G. , Irwin, K. , Rudman, D. , Deiker, S. , Bergren, N. and Martinis, J. (2000), Microcalorimeter EDS for Low Voltage Microanalysis, Inst. Phys. Conf. Ser. Symp. 2, Kona, HI, USA (Accessed December 3, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 31, 2000, Updated October 12, 2021