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Microcalorimeter EDS for Low Voltage Microanalysis

Published

Author(s)

David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
Proceedings Title
Inst. Phys. Conf. Ser. Symp. 2
Volume
165
Conference Dates
July 9-13, 2000
Conference Location
Kona, HI, USA
Conference Title
2nd Conf. Int. Union Microbeam Analysis Societies

Citation

Wollman, D. , Newbury, D. , Nam, S. , Hilton, G. , Irwin, K. , Rudman, D. , Deiker, S. , Bergren, N. and Martinis, J. (2000), Microcalorimeter EDS for Low Voltage Microanalysis, Inst. Phys. Conf. Ser. Symp. 2, Kona, HI, USA (Accessed December 3, 2024)

Issues

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Created July 31, 2000, Updated October 12, 2021