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Displaying 26 - 50 of 212

NIST Measurement Services: Regular Spectral Transmittance

March 10, 2011
Author(s)
David W. Allen, Edward A. Early, Benjamin K. Tsai, Catherine C. Cooksey
This document describes measurement services, instrumentation, and measurement techniques for regular spectral transmittance over the spectral range from 250 nm to 2500 nm at the National Institute of Standards and Technology. Section 2 explains the basic

Temperature Fundamentals

December 29, 2009
Author(s)
Benjamin K. Tsai, Graham Machin
In this chapter the basic principles of temperature, its definition and measurement are given. Beginning with a brief outline of the fundamental principles, the reader is introduced to the concept of thermodynamic temperature and some of the primary means

The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm

August 21, 2009
Author(s)
Howard W. Yoon, David W. Allen, George P. Eppeldauer, Benjamin K. Tsai
Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility are

A Summary of Lightpipe Radiation Thermometry Research at NIST

April 1, 2006
Author(s)
Benjamin K. Tsai
During the last ten years, research in lightpipe radiation thermometry has significantly reduced the uncertainties for temperature measurements in semiconductor processing. The National Institute of Standards and Technology (NIST) has improved the

Infrared Emittance Measurements at NIST

October 5, 2005
Author(s)
Leonard M. Hanssen, Benjamin K. Tsai, Sergey Mekhontsev
A new capability for the measurement of the temperature-dependent emittance of specular samples in the near infrared spectral region has been developed in NIST s Infrared Spectrophotometry Laboratory to provide emittance measurements and standards for a