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Improving Temperature Accuracy for Rapid Thermal Processing at NIST

Published

Author(s)

Benjamin K. Tsai, D P. DeWitt
Proceedings Title
NCSL International Conference
Conference Dates
August 4-8, 2002
Conference Location
San Diego, CA
Conference Title
Proc. NCSL International Conference

Citation

Tsai, B. and DeWitt, D. (2002), Improving Temperature Accuracy for Rapid Thermal Processing at NIST, NCSL International Conference , San Diego, CA (Accessed May 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2002, Updated February 17, 2017