Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Emissivity Compensated Pyrometry for Specular Silicon Surfaces on the NIST RTP Test Bed

Published

Author(s)

J Bodycomb, D P. DeWitt, W A. Kimes, K G. Kreider, Benjamin K. Tsai
Proceedings Title
12th IEE Intl. Conf. on Advanced Thermal Processing RTP 2004
Conference Dates
September 28-30, 2004
Conference Location
Portland, OR, USA
Conference Title
Proc. the 12th IEE Intl. Conf. on Advanced Thermal Processing RTP 2004

Citation

Bodycomb, J. , DeWitt, D. , Kimes, W. , Kreider, K. and Tsai, B. (2004), Emissivity Compensated Pyrometry for Specular Silicon Surfaces on the NIST RTP Test Bed, 12th IEE Intl. Conf. on Advanced Thermal Processing RTP 2004 , Portland, OR, USA (Accessed May 28, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2003, Updated October 12, 2021