Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Wen-Li Wu (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 176 - 193 of 193

Shear Induced Polymer Melt Desorption From an Attractive Substrate

June 24, 1999
Author(s)
Eric K. Lin, R Kolb, Wen-Li Wu, Sushil K. Satija
Shear induced adsorption/desorption of a highly entangled polymer melt from an attractive interface was directly observed using neutron reflectometry. The concentration of poly(methyl methacrylate) (d-PMMA) in a hydrogenated PMMA matrix was measured within

Polymer Mobility Near the Polymer/Solid Interface

May 6, 1999
Author(s)
Eric K. Lin, Wen-Li Wu, Sushil K. Satija, R Kolb
Neutron reflectometry is used to measure polymer mobility near an attractive solid surface over distances less than the bulk polymer radius of gyration, R g. Effective diffusion coefficients, D eff, are determined from the rates of interdiffusion between

Characterization of Planarity of Polymer Thin Films on Rough Surfaces

July 1, 1998
Author(s)
Wen-Li Wu, William E. Wallace
Angle-dependent total reflection x-ray fluorescence (TRXF) is used to characterize the surface roughness or the extent of planarization of a thin polymer coating on a stainless steel surface with significant roughness. The objective of this work is to

A Novel Method to Determine the Mechanical Properties of Ultra-Thin Films

April 1, 1998
Author(s)
Christopher C. White, Wen-Li Wu
Recent experimental results based on x-ray reflectivity, ellipsometry and positron annihilation spectroscopy, etc. have demonstrated that physical properties of polymer films thinner than one micron may deviate significantly from the expected bulk values
Was this page helpful?