NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films

Published

Author(s)

X Z. Hu, K Shin, Miriam Rafailovich, J Sokolov, R Stein, Y Chan, K. L. Williams, Wen-Li Wu, R Kolb
Citation
High Performance Polymers
Volume
12(4)
Pub Type
Journals

Download Paper

Local Download

Keywords

birefringence, microstructure, optical properties, polymer processing, polystyrene, refractive index, solvent cast, spin coating, thin film, thin films

Citation

Hu, X. , Shin, K. , Rafailovich, M. , Sokolov, J. , Stein, R. , Chan, Y. , Williams, K. , Wu, W. and Kolb, R. (2000), Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films, High Performance Polymers, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853679 (Accessed October 24, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 1999, Updated October 12, 2021
Was this page helpful?