Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films

Published

Author(s)

X Z. Hu, K Shin, Miriam Rafailovich, J Sokolov, R Stein, Y Chan, K. L. Williams, Wen-Li Wu, R Kolb
Citation
High Performance Polymers
Volume
12(4)

Keywords

birefringence, microstructure, optical properties, polymer processing, polystyrene, refractive index, solvent cast, spin coating, thin film, thin films

Citation

Hu, X. , Shin, K. , Rafailovich, M. , Sokolov, J. , Stein, R. , Chan, Y. , Williams, K. , Wu, W. and Kolb, R. (2000), Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films, High Performance Polymers, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853679 (Accessed May 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1999, Updated October 12, 2021