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Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films

Published

Author(s)

X Z. Hu, K Shin, Miriam Rafailovich, J Sokolov, R Stein, Y Chan, K. L. Williams, Wen-Li Wu, R Kolb
Citation
High Performance Polymers
Volume
12(4)

Keywords

birefringence, microstructure, optical properties, polymer processing, polystyrene, refractive index, solvent cast, spin coating, thin film, thin films

Citation

Hu, X. , Shin, K. , Rafailovich, M. , Sokolov, J. , Stein, R. , Chan, Y. , Williams, K. , Wu, W. and Kolb, R. (2000), Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films, High Performance Polymers, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853679 (Accessed October 16, 2025)

Issues

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Created December 31, 1999, Updated October 12, 2021
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