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Shear Induced Polymer Melt Desorption From an Attractive Substrate

Published

Author(s)

Eric K. Lin, R Kolb, Wen-Li Wu, Sushil K. Satija

Abstract

Shear induced adsorption/desorption of a highly entangled polymer melt from an attractive interface was directly observed using neutron reflectometry. The concentration of poly(methyl methacrylate) (d-PMMA) in a hydrogenated PMMA matrix was measured within 20 {Angstroms} of the surface of silicon wafers after an applied shear deformation. Substantial decreases in the surface concentration of d-PMMA relative to that in the static case were observed with increasing shear rates.
Citation
Physical Review Letters

Keywords

neutron reflectivity, polymer desorption, polymer dynamics, polymer-solid interface

Citation

Lin, E. , Kolb, R. , Wu, W. and Satija, S. (1999), Shear Induced Polymer Melt Desorption From an Attractive Substrate, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851465 (Accessed June 25, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 24, 1999, Updated February 17, 2017