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Search Publications by: Mark D. Vaudin (Assoc)

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Displaying 51 - 75 of 92

Texture Measurements in Fiber-Oriented PMN-PT

April 9, 2006
Author(s)
Kristen H. Brosnan, G L. Messing, Richard J. Meyer, Mark D. Vaudin
Textured (1-x)(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-PT) ceramics obtained by the templated grain growth (TGG) process a significant fraction of the piezoelectric properties of the Bridgman growth single crystals at a fraction of the cost. These materials could have

High Degree of Crystalline Perfection in Spontaneously Grown GaN Nanowires

January 1, 2006
Author(s)
Kristine A. Bertness, Alexana Roshko, Albert Davydov, Igor Levin, Mark D. Vaudin, Joy Barker, John B. Schlager, Norman Sanford, Larry Robins
We have grown a variety of isolated GaN nanowires using gas-source molecular beam epitaxy (MBE) and characterized their structural and optical properties. The nanowires have demonstrated a number of promising materials characteristics, including low defect

Composition and Carrier Concentration Dependence of the Electronic Structure of InyGa1-yAs1-xNx Films With Nitrogen Mole Fraction Less Than 0.012

November 1, 2005
Author(s)
Youn S. Kang, Lawrence H. Robins, Anthony Birdwell, Alexander J. Shapiro, W. R. Thurber, Mark D. Vaudin, M M. Fahmi, D Bryson, S N. Mohammad
The electronic structure of Si-doped InyGa1-yAs1-xNx films on GaAs substrates, grown bynitrogen-plasma-assisted molecular-beam epitaxy, was examined by photoreflectance PR spectroscopy at temperatures between 20 and 300 K. The films were approximately 0.5

Photoreflectance Study of the Electronic Structure of Si-Doped InyGa 1-y As 1-x N x Films With x

March 1, 2005
Author(s)
Youn S. Kang, Lawrence H. Robins, Anthony Birdwell, Alexander J. Shapiro, W. R. Thurber, Mark D. Vaudin, M M. Fahmi, D Bryson, S N. Mohammad
The electronic structure of Si-doped InyGa1-yAs1-xNx films on GaAs substrates, grown by nitrogen-plasma-assisted MBE, was examined by photoreflectance (PR) spectroscopy at temperatures between20 K and 300 K. The measured critical-point energies were

Horizontal Growth and In Situ Assembly of Oriented Zinc Oxide Nanowires

October 1, 2004
Author(s)
Babak Nikoobakht, Chris A. Michaels, Stephan J. Stranick, Mark D. Vaudin
The positioning and directed assembly of semiconductor nanowires (NWs) is of considerable current interest for bottom-up approaches to the engineering of intricate structures from nanoscale building blocks. We report a horizontal growth mode for ZnO NWs on

Saturation Molalities and Standard Molar Enthalpies of Solution of Cytidine(cr), Hypoxanthine(cr), Thymidine(cr), Thymine(cr), Uridine(cr), and Xanthine(cr) in H 2 O(1)

July 1, 2004
Author(s)
Yadu D. Tewari, Patrick D. Gery, Mark D. Vaudin, Alan D. Mighell, R Klein, Robert N. Goldberg
Saturation molalities, m(sat) in H 0(I) have been measure for the substances cytidine(cr), hypoxanthine(cr), thymidine(cr), thymine(cr), uridine(cr), and xanthine(cr) by using h.p.l.c. The states of hydration were established by performing Karl-Fischer

Combinatorial Investigation of Structural Quality of Au/Ni Contacts on GaN

June 1, 2004
Author(s)
Albert Davydov, Leonid A. Bendersky, William J. Boettinger, Daniel Josell, Mark D. Vaudin, C S. Chang, Ichiro Takeuchi
A combinatorial library of Au/Ni metalizations on GaN were microstructurally characterized by x-ray diffraction (XRD), electron back-scattered diffraction (EBSD) and transmission electron microscopy (TEM). The array of single- and bi-layered metal elements

Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)

September 19, 2003
Author(s)
A X. Ford, John E. Bonevich, Robert D. McMichael, Mark D. Vaudin, Thomas P. Moffat
Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibrating

A Model System for Interfacial Reactions in LTCC Materials

April 1, 2003
Author(s)
Lawrence P. Cook, Winnie K. Wong-Ng, Peter K. Schenck, Mark D. Vaudin, J Suh
Over the past decade, ceramic packaging materials have continued to increase in both chemical and structural complexity. At processing temperatures of 800 C to 900 C, the possibilities for interactions at interfaces between dissimilar materials are

Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films

May 1, 2002
Author(s)
Mark D. Vaudin, G R. Fox, G -. Kowach
Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factors were