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Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films

Published

Author(s)

Mark D. Vaudin, G R. Fox, G -. Kowach

Abstract

Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factors were mde using a technique and associated software developed at NIST (available at http://www.ceraics.nist.gov/webbook/TexturePlus/texture.htm). In both thin film systems, the texture was axisymmetric and sharp with full width at half maximum values of about 2.5 degrees.
Proceedings Title
Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage, Symposium | | Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage | Materials Research Society
Volume
721
Conference Dates
April 1, 2002
Conference Title
Materials Research Society Symposium Proceedings

Keywords

area detector, axisymmetric detector, powder diffractometer, rocking curve, standard

Citation

Vaudin, M. , Fox, G. and Kowach, G. (2002), Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films, Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage, Symposium | | Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage | Materials Research Society (Accessed June 18, 2024)

Issues

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Created May 1, 2002, Updated February 19, 2017