Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films

Published

May 1, 2002

Author(s)

Mark D. Vaudin, G R. Fox, G -. Kowach

Abstract

Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factors were mde using a technique and associated software developed at NIST (available at http://www.ceraics.nist.gov/webbook/TexturePlus/texture.htm). In both thin film systems, the texture was axisymmetric and sharp with full width at half maximum values of about 2.5 degrees.

Proceedings Title

Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage, Symposium | | Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage | Materials Research Society

Volume

721

Conference Dates

April 1, 2002

Conference Title

Materials Research Society Symposium Proceedings

Pub Type

Conferences

Keywords

area detector, axisymmetric detector, powder diffractometer, rocking curve, standard

Citation

Vaudin, M. , Fox, G. and Kowach, G. (2002), Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films, Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage, Symposium | | Magnetic and Electronic Films- Microstructure, Texture, and Application to Data Storage | Materials Research Society (Accessed March 15, 2025)