Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4

Published

Author(s)

William J. Boettinger, Mark D. Vaudin, Maureen E. Williams, Leonid A. Bendersky, W R. Wagner

Abstract

Electron backscattered diffraction and energy dispersive X-ray spectroscopy has been performed on a plate-shaped phase formed through the reaction of Sn and Ni during extended thermal cycling tests, on ceramic capacitors have electroplated tin end terminations. The morphology is identical to that of a phase labeled NiSn(Sub3) by J. Haimovich (Welding Journal Research Supplement, 8 (1989)102). The phase is shown to have a stoichiometry, NiSn(Sub4), and a crystal structure isomorphous to PdSn(Sub4), PtSn(Sub4) and AuSn(Sub4) (Aba2, #41, oC20). The structure can also be described with the higher symmetry structure (Ccca, #68, oC20).
Citation
Journal of Electronic Materials
Volume
32
Issue
No. 6

Keywords

crystal structure, intermetallic compound, Ni-Sn, solder

Citation

Boettinger, W. , Vaudin, M. , Williams, M. , Bendersky, L. and Wagner, W. (2003), Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4, Journal of Electronic Materials (Accessed April 21, 2024)
Created June 1, 2003, Updated February 17, 2017