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PUBLICATIONS

Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4

Published

Author(s)

William J. Boettinger, Mark D. Vaudin, Maureen E. Williams, Leonid A. Bendersky, W R. Wagner

Abstract

Electron backscattered diffraction and energy dispersive X-ray spectroscopy has been performed on a plate-shaped phase formed through the reaction of Sn and Ni during extended thermal cycling tests, on ceramic capacitors have electroplated tin end terminations. The morphology is identical to that of a phase labeled NiSn(Sub3) by J. Haimovich (Welding Journal Research Supplement, 8 (1989)102). The phase is shown to have a stoichiometry, NiSn(Sub4), and a crystal structure isomorphous to PdSn(Sub4), PtSn(Sub4) and AuSn(Sub4) (Aba2, #41, oC20). The structure can also be described with the higher symmetry structure (Ccca, #68, oC20).
Citation
Journal of Electronic Materials
Volume
32
Issue
No. 6
Pub Type
Journals

Keywords

crystal structure, intermetallic compound, Ni-Sn, solder

Citation

Boettinger, W. , Vaudin, M. , Williams, M. , Bendersky, L. and Wagner, W. (2003), Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4, Journal of Electronic Materials (Accessed December 7, 2024)

Issues

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Created June 1, 2003, Updated February 17, 2017