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NIST Authors in Bold

Displaying 876 - 900 of 1757

Nanosilver suppresses growth and induces oxidative damage to DNA in Caenorhabditis elegans

May 2, 2013
Author(s)
Bryant C. Nelson, Bryce J. Marquis, Piper R. Hunt, Katherine M. Tyner, Sean Conklin, Nicholas Olejnik, Robert L. Sprando
The utility of C. elegans as an alternative model to assess nanomaterial toxicity was evaluated using 10 nm silver particles (10nmAg). Endpoints of nanomaterial uptake and localization, larval growth, morphology, and DNA damage were assessed. Orally

Large Stroke Electrostatic Comb Drive Actuators Enabled by a Novel Flexure Mechanism

April 30, 2013
Author(s)
Mohammad Olfatnia, Siddharth Sood, Jason J. Gorman, Shorya Awtar
This paper reports in-plane electrostatic combdrive actuators with stroke as large as 245 μm that is achieved by employing a novel Clamped Paired Double Parallelogram (C-DPDP) flexure mechanism. The C-DP-DP flexure mechanism design offers high bearing

TSV Reveal height and bump dimension metrology by the TSOM method

April 30, 2013
Author(s)
Ravikiran Attota, Haesung Park, Victor H. Vartanian, Ndubuisi G. Orji, Richard A. Allen
Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement method

Use of TSOM for sub-11 nm node pattern defect detection and HAR features

April 30, 2013
Author(s)
Ravikiran Attota, Abraham Arceo, Bunday Benjamin
In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely be

Macroscale refrigeration by nanoscale electron transport

February 26, 2013
Author(s)
Peter J. Lowell, Galen C. O'Neil, Jason M. Underwood, Joel N. Ullom
Nano- and Micro- Electromechanical devices (NEMS & MEMS) have become ubiquitous; examples include automobile accelerometers, inkjet printer heads, infrared viewers, and mirrors for image manipulation and projection. Applications fall broadly in the

Stable Field Emission from Nanoporous Silicon Carbide

February 15, 2013
Author(s)
Myung Gyu Kang, Henri Lezec, Fred Sharifi
A new method for fabrication of high current density field emitters based on nanoporous silicon carbide is presented. The emitters are monolithic structures which do not require high temperature gas phase synthesis and the process is compatible with

NIST Gold Nanoparticle Reference Materials Do Not Induce Oxidative DNA Damage

February 1, 2013
Author(s)
Bryant C. Nelson, Donald H. Atha, John T. Elliott, Bryce J. Marquis, Elijah J. Petersen, Danielle Cleveland, Stephanie S. Watson, I-Hsiang Tseng, Andrew Dillon, Melissa Theodore, Joany Jackman
Well-characterized, nanoparticle reference materials are urgently needed for nanomaterial toxicity studies. The National Institute of Standards and Technology has developed three gold nanoparticle (AuNP) reference materials (10 nm, 30 nm, 60 nm) to address
Displaying 876 - 900 of 1757
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