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Displaying 876 - 900 of 938

Amphibole Asbestos From Libby, Montana: Aspects of Nomenclature

October 1, 2000
Author(s)
A G. Wylie, Jennifer R. Verkouteren
Richterite-asbestos and winchite-asbestos are not listed in the Federal regulations governing asbestos. However, asbestiform winchite is found in the gangue at the Libby, Montana, vermiculite deposit, where asbestos-related diseases have been reported

Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NSOM

New Low-Index Liquid Refractive Index Standard: SRM 1922

June 1, 2000
Author(s)
Jennifer R. Verkouteren, Stefan D. Leigh
A new standard for the calibration of refractometers has been developed. Standard Reference Material (SRM) 1922 is a mineral oil with a refractive index n D=1.46945 at 20 C, which is within the range of the Brix scale (% sucrose). The change in index with

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their

Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy

August 1, 1999
Author(s)
P E. Thompson, K D. Hobart, M E. Twigg, G Jernigan, T E. Dillon, S L. Rommel, P R. Berger, David S. Simons, P Chi, R Lake, A C. Seabaugh
Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 C, 1 min

SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry

August 1, 1999
Author(s)
Robert A. Fletcher, Jennifer R. Verkouteren, Eric S. Windsor, David S. Bright, Eric B. Steel, John A. Small, Walter S. Liggett Jr
Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than a

A Unique Institution: The History of NBS, 1950-1969

June 30, 1999
Author(s)
E Passaglia, K A. Beal
A follow-on to Measures for Progress by Rexmond C. Cochrane, this work covers the history of the National Bureau of Standards (NBS) from 1950-1969. While the book focuses on technical work, the management and administration of the Bureau are also discussed

Elemental and Molecular Imaging of Human Hair Using Secondary Ion Mass Spectrometry

April 1, 1999
Author(s)
John G. Gillen, S V. Roberson, C M. Ng, M Stranick
Secondary ion mass spectrometry (SIMS) is used to image the spatial distribution of elemental and molecular species on the surface and in cross-sections of doped human hair using a magnetic sector SIMS instrument operated as an ion microprobe. Analysis of

Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope

July 1, 1998
Author(s)
John G. Gillen, Scott A. Wight, David S. Bright, T M. Herne
Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scanning
Displaying 876 - 900 of 938
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