Wight, S.
and Zeissler, C.
(2000),
Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope, Microscopy and Microanalysis 2000 Meeting; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer, xxxx, -1
(Accessed October 20, 2025)
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Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope
Published
Author(s)
,
Abstract
Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensity of the grains upon reading gives a visual representation of where electrons struck the plate. This direct measurement of electron scatter is important to improving models and analytical correction procedures.Proceedings Title
Microscopy and Microanalysis 2000 Meeting; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer
Volume
6
Issue
Suppl. 2
Conference Dates
August 1, 2000
Conference Location
xxxx
Conference Title
Microscopy and Microanalysis Society
Pub Type
Conferences
Keywords
electron, ESEM, imaging, phosphor, plate, scattering
Citation
Issues
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Created August 1, 2000, Updated February 19, 2017