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What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?

Published

Author(s)

Scott A. Wight

Abstract

Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about these unwanted contributions.
Citation
Microscopy and Microanalysis
Volume
5

Keywords

energy dispersive spectrometry, environmental SEM, quantitative analysis, scanning electron microscope

Citation

Wight, S. (1999), What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?, Microscopy and Microanalysis (Accessed July 20, 2024)

Issues

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Created August 1, 1999, Updated February 19, 2017