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PUBLICATIONS

What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?

Published

Author(s)

Scott A. Wight

Abstract

Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about these unwanted contributions.
Citation
Microscopy and Microanalysis
Volume
5
Pub Type
Journals

Keywords

energy dispersive spectrometry, environmental SEM, quantitative analysis, scanning electron microscope
Chemistry and Nanotechnology

Citation

Wight, S. (1999), What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?, Microscopy and Microanalysis (Accessed October 3, 2025)

Issues

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Created August 1, 1999, Updated February 19, 2017
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