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Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates

Published

Author(s)

Scott A. Wight, Cynthia J. Zeissler

Abstract

Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering conditions in the microscope chamber. When processed, the electron intensity distribution is displayed as a digital image. The image is a visual representation of the electron probe and skirt and may provide the basis for a more accurate model.
Citation
Scanning
Volume
22
Issue
No. 3

Keywords

electron scattering, environmental scanning electron microsco, phosphor imaging plates, photostimulable

Citation

Wight, S. and Zeissler, C. (2000), Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates, Scanning (Accessed June 25, 2024)

Issues

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Created May 1, 2000, Updated February 19, 2017