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Displaying 59001 - 59025 of 74657

X-ray sources in regions of star formation. V. The low mass stars of the Upper Scorpius association

January 1, 1994

Author(s)

F M. Walter, F J. Vrba, R D. Mathieu, A Brown, P C. Myers

ZAMS stars in our own backyard- The rotationactivity relations

January 1, 1994

Author(s)

C W. Ambruster, A Brown, F C. Fekel

Zeeman Coherences and Dark States in Optically Pumped Cesium Frequency Standards

January 1, 1994

Author(s)

Jon H. Shirley, Robert E. Drullinger

American Ceramic Society

December 31, 1993

Author(s)

J. A. Carpenter, B. Dickens, Kenneth G. Kreider, John R. Manning, R. L. Mattis, D. P. Read, R. D. Evans

An Electrical Test Structure for Improved Measurement of Feature Placement and Overlay in Integrated Circuit Fabrication Processes

December 31, 1993

Author(s)

Richard A. Allen, C. E. Schuster

Characterization of Interface Defects in SIMOX Films

December 31, 1993

Author(s)

Santos D. Mayo, J R. Lowney, Peter Roitman

Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry

December 31, 1993

Author(s)

R. Dahmani, Lourdes Salamanca-Riba, Nhan Van Nguyen, Deane Chandler-Horowitz, B T. Jonker

Electro-Thermal Simulation of an IGBT PWM Inverter

December 31, 1993

Author(s)

Alan Mantooth, Allen R. Hefner Jr.

Enhanced Machine Controller Architecture Overview

December 31, 1993

Author(s)

Frederick M. Proctor, John L. Michaloski

Even-Odd Symmetry Breaking in the NSN Coulomb Blockade Electrometer

December 31, 1993

Author(s)

Travis M. Eiles, John M. Martinis, Michel H. Devoret

Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET)

December 31, 1993

Author(s)

G. Busatto, David L. Blackburn, David W. Berning

Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs

December 31, 1993

Author(s)

David G. Seiler, Santos D. Mayo, J R. Lowney

Hot-Electron Microcalorimeters for X-Ray and Phonon Detection

December 31, 1993

Author(s)

M. Nahum, John M. Martinis, S. Castles

Interface Sharpness During the Initial Stages of Growth of Thin, Short-Period III-V Superlattices

December 31, 1993

Author(s)

Joseph G. Pellegrino, S. B. Qadri, C. M. Cotell, Paul M. Amirtharaj, Nhan Van Nguyen, J. Comas

Metrology Standards For Advanced Semiconductor Lithography Referenced to Atomic Spacings and Geometry

December 31, 1993

Author(s)

E C. Teague, Loren W. Linholm, Michael W. Cresswell, William B. Penzes, John A. Kramar, Fredric Scire, John S. Villarrubia, Jay S. Jun