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Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET)

Published

Author(s)

G. Busatto, David L. Blackburn, David W. Berning
Proceedings Title
Proc., 24th Annual IEEE Power Electronics Specialists Conference
Issue
6
Conference Dates
June 20-24, 1993
Conference Location
Seattle, WA, USA

Citation

Busatto, G. , Blackburn, D. and Berning, D. (1993), Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET), Proc., 24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA (Accessed June 13, 2024)

Issues

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Created December 30, 1993, Updated October 12, 2021