Busatto, G.
, Blackburn, D.
and Berning, D.
(1993),
Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET), Proc., 24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA
(Accessed December 5, 2024)
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Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET)
Published
Author(s)
G. Busatto, ,
Proceedings Title
Proc., 24th Annual IEEE Power Electronics Specialists Conference
Issue
6
Conference Dates
June 20-24, 1993
Conference Location
Seattle, WA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1993, Updated October 12, 2021