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PUBLICATIONS

Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET)

Published

Author(s)

G. Busatto, David L. Blackburn, David W. Berning
Proceedings Title
Proc., 24th Annual IEEE Power Electronics Specialists Conference
Issue
6
Conference Dates
June 20-24, 1993
Conference Location
Seattle, WA, USA
Pub Type
Conferences

Citation

Busatto, G. , Blackburn, D. and Berning, D. (1993), Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET), Proc., 24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA (Accessed October 25, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1993, Updated October 12, 2021
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