TY - CONF AU - Busatto, G. AU - Blackburn, David AU - Berning, David C2 - Proc., 24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA DA - 1993-12-31 00:12:00 LA - en PB - Proc., 24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA PY - 1993 TI - Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET) ER -