TY  - CONF
AU  - G. Busatto
AU  - David Blackburn
AU  - David Berning
C2  - Proc.,  24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA
DA  - 1993-12-31 00:12:00
LA  - en
PB  - Proc.,  24th Annual IEEE Power Electronics Specialists Conference, Seattle, WA, USA
PY  - 1993
TI  - Experimental Study of Reverse-Bias Failure Mechanisms in Bipolar Mode JFET (BMFET)
ER  -